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Additive manufacturing (AM), particularly 3D printing, has revolutionized the production of complex structures across various industries. However, ensuring quality and detecting defects in 3D-printed objects remain significant challenges.…

图像与视频处理 · 电气工程与系统科学 2024-04-29 Md Manjurul Ahsan , Shivakumar Raman , Zahed Siddique

Accurate Defect detection is crucial for ensuring the trustworthiness of intelligent railway systems. Current approaches rely on single deep-learning models, like CNNs, which employ a large amount of data to capture underlying patterns.…

计算机视觉与模式识别 · 计算机科学 2023-11-28 Rahatara Ferdousi , Fedwa Laamarti , Chunsheng Yang , Abdulmotaleb El Saddik

Additive manufacturing (AM) enables the development of high-performance architected cellular materials, emphasizing the growing importance of establishing programmable and predictable energy absorption capabilities. This study evaluates the…

应用物理 · 物理学 2024-02-27 Mattia Utzeri , Marco Sasso , Vikram S. Deshpande , S. Kumar

Anomaly detection in complex industrial environments poses unique challenges, particularly in contexts characterized by data sparsity and evolving operational conditions. Predictive maintenance (PdM) in such settings demands methodologies…

Fatigue properties of additively manufactured (AM) materials depend on many factors such as AM processing parameter, microstructure, residual stress, surface roughness, porosities, post-treatments, etc. Their evaluation inevitably requires…

Training supervised deep neural networks that perform defect detection and segmentation requires large-scale fully-annotated datasets, which can be hard or even impossible to obtain in industrial environments. Generative AI offers…

计算机视觉与模式识别 · 计算机科学 2024-01-09 Gabriele Valvano , Antonino Agostino , Giovanni De Magistris , Antonino Graziano , Giacomo Veneri

The use of additive manufacturing (AM) processes for industrial fabrication has grown rapidly over the last ten years. The most well-known AM technologies are fused deposition modelling and stereolithography techniques. One particular…

Industry 4.0 has revolutionized manufacturing by driving digitalization and shifting the paradigm toward additive manufacturing (AM). Fused Deposition Modeling (FDM), a key AM technology, enables the creation of highly customized,…

计算与语言 · 计算机科学 2026-01-01 Yayati Jadhav , Peter Pak , Amir Barati Farimani

Approximate matching (AM) is a concept in digital forensics to determine the similarity between digital artifacts. An important use case of AM is the reliable and efficient detection of case-relevant data structures on a blacklist, if only…

密码学与安全 · 计算机科学 2023-04-28 Frieder Uhlig , Lukas Struppek , Dominik Hintersdorf , Thomas Göbel , Harald Baier , Kristian Kersting

Microfluidic devices offer numerous advantages in medical applications, including the capture of single cells in microwell-based platforms for genomic analysis. As the cost of sequencing decreases, the demand for high-throughput single-cell…

计算工程、金融与科学 · 计算机科学 2024-09-13 Xueying Zhao , Yan Chen , Yuefu Jiang , Amie Radenbaugh , Jamie Moskwa , Devon Jensen

In additive manufacturing, the optimal processing conditions need to be determined to fabricate porosity-free parts. For this purpose, the design space for an arbitrary alloy needs to be scoped and analyzed to identify the areas of defects…

The efficacy of Artificial Intelligence (AI) in micro/nano manufacturing is fundamentally constrained by the scarcity of high-quality and physically grounded training data for defect inspection. Lithography defect data from semiconductor…

计算机视觉与模式识别 · 计算机科学 2025-12-11 Yuehua Hu , Jiyeong Kong , Dong-yeol Shin , Jaekyun Kim , Kyung-Tae Kang

Anomaly detection is a crucial process in industrial manufacturing and has made significant advancements recently. However, there is a large variance between the data used in the development and the data collected by the production…

计算机视觉与模式识别 · 计算机科学 2024-09-11 Tianwu Lei , Bohan Wang , Silin Chen , Shurong Cao , Ningmu Zou

The deployment of machine learning (ML)-based process monitoring systems has significantly advanced additive manufacturing (AM) by enabling real-time defect detection, quality assessment, and process optimization. However, redundancy is a…

计算工程、金融与科学 · 计算机科学 2025-05-01 Jiarui Xie , Yaoyao Fiona Zhao

The performances of defect inspection have been severely hindered by insufficient defect images in industries, which can be alleviated by generating more samples as data augmentation. We propose the first defect image generation method in…

计算机视觉与模式识别 · 计算机科学 2023-03-07 Yuxuan Duan , Yan Hong , Li Niu , Liqing Zhang

In industry, defect detection is crucial for quality control. Non-destructive testing (NDT) methods are preferred as they do not influence the functionality of the object while inspecting. Automated data evaluation for automated defect…

计算机视觉与模式识别 · 计算机科学 2026-02-06 Natascha Jeziorski , Petra Gospodnetić , Claudia Redenbach

The field of additive manufacturing (AM) has advanced considerably over recent decades through the development of novel methods, materials, and systems. However, as the field approaches maturity, it is relevant to investigate the scaling…

材料科学 · 物理学 2023-07-28 David M. Wirth , Chi Chung Li , Jonathan K. Pokorski , Hayden K. Taylor , Maxim Shusteff

Industrial X-ray analysis is common in aerospace, automotive or nuclear industries where structural integrity of some parts needs to be guaranteed. However, the interpretation of radiographic images is sometimes difficult and may lead to…

计算机视觉与模式识别 · 计算机科学 2022-09-07 Alberto García-Pérez , María José Gómez-Silva , Arturo de la Escalera

In semiconductor manufacturing, the wafer dicing process is central yet vulnerable to defects that significantly impair yield - the proportion of defect-free chips. Deep neural networks are the current state of the art in (semi-)automated…

计算机视觉与模式识别 · 计算机科学 2024-07-31 Zhining Hu , Tobias Schlosser , Michael Friedrich , André Luiz Vieira e Silva , Frederik Beuth , Danny Kowerko

Precision in identifying nanometer-scale device-killer defects is crucial in both semiconductor research and development as well as in production processes. The effectiveness of existing ML-based approaches in this context is largely…

计算机视觉与模式识别 · 计算机科学 2024-07-16 Bappaditya Dey , Vic De Ridder , Victor Blanco , Sandip Halder , Bartel Van Waeyenberge