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Ensuring software quality remains a critical challenge in complex and dynamic development environments, where software defects can result in significant operational and financial risks. This paper proposes an innovative framework for…

Anomaly detection in industrial visual inspection is challenging due to the scarcity of defective samples. Most existing methods rely on unsupervised reconstruction using only normal data, often resulting in overfitting and poor detection…

计算机视觉与模式识别 · 计算机科学 2025-11-26 Amirhossein Khadivi Noghredeh , Abdollah Safari , Fatemeh Ziaeetabar , Firoozeh Haghighi

In this research work, we have demonstrated the application of Mask-RCNN (Regional Convolutional Neural Network), a deep-learning algorithm for computer vision and specifically object detection, to semiconductor defect inspection domain.…

计算机视觉与模式识别 · 计算机科学 2022-11-07 Bappaditya Dey , Enrique Dehaerne , Kasem Khalil , Sandip Halder , Philippe Leray , Magdy A. Bayoumi

This work is addressing the problem of defect anomaly detection based on a clean reference image. Specifically, we focus on SEM semiconductor defects in addition to several natural image anomalies. There are well-known methods to create a…

计算机视觉与模式识别 · 计算机科学 2023-03-22 Nati Ofir , Yotam Ben Shoshan , Ran Badanes , Boris Sherman

Feature selection aims to preprocess the target dataset, find an optimal and most streamlined feature subset, and enhance the downstream machine learning task. Among filter, wrapper, and embedded-based approaches, the reinforcement learning…

人工智能 · 计算机科学 2025-09-17 Weiliang Zhang , Xiaohan Huang , Yi Du , Ziyue Qiao , Qingqing Long , Zhen Meng , Yuanchun Zhou , Meng Xiao

A growing need exists for efficient and accurate methods for detecting defects in semiconductor materials and devices. These defects can have a detrimental impact on the efficiency of the manufacturing process, because they cause critical…

计算机视觉与模式识别 · 计算机科学 2023-08-21 Thibault Lechien , Enrique Dehaerne , Bappaditya Dey , Victor Blanco , Sandip Halder , Stefan De Gendt , Wannes Meert

Continual shrinking of pattern dimensions in the semiconductor domain is making it increasingly difficult to inspect defects due to factors such as the presence of stochastic noise and the dynamic behavior of defect patterns and types.…

计算机视觉与模式识别 · 计算机科学 2023-08-16 Vic De Ridder , Bappaditya Dey , Enrique Dehaerne , Sandip Halder , Stefan De Gendt , Bartel Van Waeyenberge

Overhead line inspection greatly benefits from defect recognition using visible light imagery. Addressing the limitations of existing feature extraction techniques and the heavy data dependency of deep learning approaches, this paper…

计算机视觉与模式识别 · 计算机科学 2023-12-08 Weixi Wang , Xichen Zhong , Xin Li , Sizhe Li , Xun Ma

Learning-based approaches for semantic segmentation have two inherent challenges. First, acquiring pixel-wise labels is expensive and time-consuming. Second, realistic segmentation datasets are highly unbalanced: some categories are much…

计算机视觉与模式识别 · 计算机科学 2020-02-18 Arantxa Casanova , Pedro O. Pinheiro , Negar Rostamzadeh , Christopher J. Pal

Precision in identifying nanometer-scale device-killer defects is crucial in both semiconductor research and development as well as in production processes. The effectiveness of existing ML-based approaches in this context is largely…

计算机视觉与模式识别 · 计算机科学 2024-07-16 Bappaditya Dey , Vic De Ridder , Victor Blanco , Sandip Halder , Bartel Van Waeyenberge

It is important to extract good features using an encoder to realize semantic segmentation with high accuracy. Although loss function is optimized in training deep neural network, far layers from the layers for computing loss function are…

图像与视频处理 · 电气工程与系统科学 2021-01-21 Takamasa Ando , Kazuhiro Hotta

This paper proposes a novel logo image recognition approach incorporating a localization technique based on reinforcement learning. Logo recognition is an image classification task identifying a brand in an image. As the size and position…

计算机视觉与模式识别 · 计算机科学 2023-12-29 Masato Fujitake

Methods that combine local and global features have recently shown excellent performance on multiple challenging deep image retrieval benchmarks, but their use of local features raises at least two issues. First, these local features simply…

计算机视觉与模式识别 · 计算机科学 2022-02-01 Philippe Weinzaepfel , Thomas Lucas , Diane Larlus , Yannis Kalantidis

Feature selection plays a crucial role in improving predictive accuracy by identifying relevant features while filtering out irrelevant ones. This study investigates the importance of effective feature selection in enhancing the performance…

机器学习 · 计算机科学 2024-03-12 Younes Ghazagh Jahed , Seyyed Ali Sadat Tavana

Effective feature selection, representation and transformation are principal steps in machine learning to improve prediction accuracy, model generalization and computational efficiency. Reinforcement learning provides a new perspective…

机器学习 · 计算机科学 2025-03-18 Sumana Sanyasipura Nagaraju

A distinctive representation of image patches in form of features is a key component of many computer vision and robotics tasks, such as image matching, image retrieval, and visual localization. State-of-the-art descriptors, from…

计算机视觉与模式识别 · 计算机科学 2022-09-28 Hao Dong , Xieyuanli Chen , Mihai Dusmanu , Viktor Larsson , Marc Pollefeys , Cyrill Stachniss

We present Seg-R1, a preliminary exploration of using reinforcement learning (RL) to enhance the pixel-level understanding and reasoning capabilities of large multimodal models (LMMs). Starting with foreground segmentation tasks,…

计算机视觉与模式识别 · 计算机科学 2025-07-01 Zuyao You , Zuxuan Wu

With the ever-growing variety of object detection approaches, this study explores a series of experiments that combine reinforcement learning (RL)-based visual attention methods with saliency ranking techniques to investigate transparent…

计算机视觉与模式识别 · 计算机科学 2024-11-06 Matthias Bartolo , Dylan Seychell , Josef Bajada

The challenging field of scene text detection requires complex data annotation, which is time-consuming and expensive. Techniques, such as weak supervision, can reduce the amount of data needed. In this paper we propose a weak supervision…

计算机视觉与模式识别 · 计算机科学 2022-01-14 Emanuel Metzenthin , Christian Bartz , Christoph Meinel

Deep reinforcement learning (DRL) has shown success in diverse domains such as robotics, computer games, and recommendation systems. However, like any other software system, DRL-based software systems are susceptible to faults that pose…

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