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Electron tomography (ET) plays an important role in the three-dimensional (3D) characterization of nanomaterials. However, under limited-angle and sparse-view conditions, conventional algorithms produce degraded reconstructions, which…

图像与视频处理 · 电气工程与系统科学 2026-05-27 Serge Brosset , Daniel del Pozo Bueno , Thomas David , Laure Guetaz , Philippe Ciuciu , Zineb Saghi

Resonant transmission of light is a surface-wave assisted phenomenon that enables funneling light through subwavelength apertures milled in otherwise opaque metallic screens. In this work, we introduce a deep learning approach to…

光学 · 物理学 2021-06-25 David Alonso-Gonzalez , Michel Frising , Ferry Prins , Jorge Bravo-Abad

Depth image super-resolution is an extremely challenging task due to the information loss in sub-sampling. Deep convolutional neural network have been widely applied to color image super-resolution. Quite surprisingly, this success has not…

计算机视觉与模式识别 · 计算机科学 2016-07-08 Xibin Song , Yuchao Dai , Xueying Qin

Microscopic characterizations, such as Scanning Electron Microscopy (SEM), are widely used in scientific research for visualizing and analyzing microstructures. Determining the scale bars is an important first step of accurate SEM analysis;…

计算机视觉与模式识别 · 计算机科学 2025-10-14 Yuxuan Chen , Ruotong Yang , Zhengyang Zhang , Mehreen Ahmed , Yanming Wang

Seeing and recognizing an object whose size is much smaller than the illumination wavelength is a challenging task for an observer placed in the far field, due to the diffraction limit. Recent advances in near and far field microscopy have…

应用物理 · 物理学 2020-08-19 Bakhtiyar Orazbayev , Romain Fleury

Hyperspectral (HS) images contain detailed spectral information that has proven crucial in applications like remote sensing, surveillance, and astronomy. However, because of hardware limitations of HS cameras, the captured images have low…

图像与视频处理 · 电气工程与系统科学 2021-06-15 Marija Vella , Bowen Zhang , Wei Chen , João F. C. Mota

In the rapidly evolving field of optical engineering, precise alignment of multi-lens imaging systems is critical yet challenging, as even minor misalignments can significantly degrade performance. Traditional alignment methods rely on…

光学 · 物理学 2025-07-01 Tomer Slor , Dean Oren , Shira Baneth , Tom Coen , Haim Suchowski

Semantic segmentation is an important and popular research area in computer vision that focuses on classifying pixels in an image based on their semantics. However, supervised deep learning requires large amounts of data to train models and…

计算机视觉与模式识别 · 计算机科学 2025-03-19 Lingyan Ran , Yali Li , Guoqiang Liang , Yanning Zhang

We discuss recently emerging applications of the state-of-art deep learning methods on optical microscopy and microscopic image reconstruction, which enable new transformations among different modes and modalities of microscopic imaging,…

机器学习 · 计算机科学 2018-07-23 Yair Rivenson , Aydogan Ozcan

Hyperspectral imagers on satellites obtain the fine spectral signatures essential for distinguishing one material from another at the expense of limited spatial resolution. Enhancing the latter is thus a desirable preprocessing step in…

图像与视频处理 · 电气工程与系统科学 2025-11-11 Davide Piccinini , Diego Valsesia , Enrico Magli

We present a physics-informed deep learning framework to address common limitations in Confocal Laser Scanning Microscopy (CLSM), such as diffraction limited resolution, noise, and undersampling due to low laser power conditions. The…

Advanced microscopy and/or spectroscopy tools play indispensable role in nanoscience and nanotechnology research, as it provides rich information about the growth mechanism, chemical compositions, crystallography, and other important…

Deep learning has become an extremely effective tool for image classification and image restoration problems. Here, we apply deep learning to microscopy, and demonstrate how neural networks can exploit the chromatic dependence of the…

光学 · 物理学 2018-07-05 Eran Hershko* , Lucien E. Weiss* , Tomer Michaeli , Yoav Shechtman

Characterisation of rare microstructural features in scanning electron microscopy (SEM) requires imaging large areas at high resolution. This leads to prohibitively long acquisition times. We present an open-source Python framework that…

Most deep learning-based super-resolution (SR) methods are not image-specific: 1) They are trained on samples synthesized by predefined degradations (e.g. bicubic downsampling), regardless of the domain gap between training and testing…

计算机视觉与模式识别 · 计算机科学 2022-03-16 Shang Li , Guixuan Zhang , Zhengxiong Luo , Jie Liu , Zhi Zeng , Shuwu Zhang

Pansharpening is a crucial task in remote sensing, enabling the generation of high-resolution multispectral images by fusing low-resolution multispectral data with high-resolution panchromatic images. This paper provides a comprehensive…

图像与视频处理 · 电气工程与系统科学 2024-12-09 Mahek Kantharia , Neeraj Badal , Zankhana Shah

A combinatory approach of two well-known fields: deep learning and semi supervised learning is presented, to tackle the land cover identification problem. The proposed methodology demonstrates the impact on the performance of deep learning…

计算机视觉与模式识别 · 计算机科学 2020-06-02 Eftychios Protopapadakis , Anastasios Doulamis , Nikolaos Doulamis , Evangelos Maltezos

Among underwater perceptual sensors, imaging sonar has been highlighted for its perceptual robustness underwater. The major challenge of imaging sonar, however, arises from the difficulty in defining visual features despite limited…

机器人学 · 计算机科学 2018-10-19 Sejin Lee , Byungjae Park , Ayoung Kim

Hyperspectral image analysis has become an important topic widely researched by the remote sensing community. Classification and segmentation of such imagery help understand the underlying materials within a scanned scene, since…

计算机视觉与模式识别 · 计算机科学 2020-12-02 Jakub Nalepa , Michal Myller , Yasuteru Imai , Ken-ichi Honda , Tomomi Takeda , Marek Antoniak

In this research work, we have demonstrated the application of Mask-RCNN (Regional Convolutional Neural Network), a deep-learning algorithm for computer vision and specifically object detection, to semiconductor defect inspection domain.…

计算机视觉与模式识别 · 计算机科学 2022-11-07 Bappaditya Dey , Enrique Dehaerne , Kasem Khalil , Sandip Halder , Philippe Leray , Magdy A. Bayoumi