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Effectively addressing the challenge of industrial Anomaly Detection (AD) necessitates an ample supply of defective samples, a constraint often hindered by their scarcity in industrial contexts. This paper introduces a novel algorithm…

计算机视觉与模式识别 · 计算机科学 2024-03-27 Hanxi Li , Zhengxun Zhang , Hao Chen , Lin Wu , Bo Li , Deyin Liu , Mingwen Wang

In recent years, defect prediction techniques based on deep learning have become a prominent research topic in the field of software engineering. These techniques can identify potential defects without executing the code. However, existing…

软件工程 · 计算机科学 2024-05-20 Ying Xing , Mengci Zhao , Bin Yang , Yuwei Zhang , Wenjin Li , Jiawei Gu , Jun Yuan

The defect detection task can be regarded as a realistic scenario of object detection in the computer vision field and it is widely used in the industrial field. Directly applying vanilla object detector to defect detection task can achieve…

计算机视觉与模式识别 · 计算机科学 2021-08-11 Zhaoyang Zeng , Bei Liu , Jianlong Fu , Hongyang Chao

Transfer learning is a key component of modern machine learning, enhancing the performance of target tasks by leveraging diverse data sources. Simultaneously, overparameterized models such as the minimum-$\ell_2$-norm interpolator (MNI) in…

机器学习 · 统计学 2026-01-19 Yeichan Kim , Ilmun Kim , Seyoung Park

Controlling defects in semiconductor processes is important for maintaining yield, improving production cost, and preventing time-dependent critical component failures. Electron beam-based imaging has been used as a tool to survey wafers in…

计算机视觉与模式识别 · 计算机科学 2025-06-05 Chien-Fu , Huang , Katherine Sieg , Leonid Karlinksy , Nash Flores , Rebekah Sheraw , Xin Zhang

Network Intrusion Detection Systems (IDS) aim to detect the presence of an intruder by analyzing network packets arriving at an internet connected device. Data-driven deep learning systems, popular due to their superior performance compared…

密码学与安全 · 计算机科学 2024-01-09 Shreya Ghosh , Abu Shafin Mohammad Mahdee Jameel , Aly El Gamal

Maintaining sewer systems in large cities is important, but also time and effort consuming, because visual inspections are currently done manually. To reduce the amount of aforementioned manual work, defects within sewer pipes should be…

计算机视觉与模式识别 · 计算机科学 2024-04-10 Bach Ha , Birgit Schalter , Laura White , Joachim Koehler

The quality control of printed circuit boards (PCBs) is paramount in advancing electronic device technology. While numerous machine learning methodologies have been utilized to augment defect detection efficiency and accuracy, previous…

机器学习 · 计算机科学 2024-09-17 Ka Nam Canaan Law , Mingshuo Yu , Lianglei Zhang , Yiyi Zhang , Peng Xu , Jerry Gao , Jun Liu

Material defects (MD) represent a primary challenge affecting product performance and giving rise to safety issues in related products. The rapid and accurate identification and localization of MD constitute crucial research endeavors in…

计算机视觉与模式识别 · 计算机科学 2025-05-06 Jun Bai , Di Wu , Tristan Shelley , Peter Schubel , David Twine , John Russell , Xuesen Zeng , Ji Zhang

In practical scenarios, processes such as sensor design, manufacturing, and installation will introduce certain errors. Furthermore, mutual interference occurs when the sensors receive signals. These defects in array systems are referred to…

信号处理 · 电气工程与系统科学 2026-01-12 Bo Zhou , Kaijie Xu , Yinghui Quan , Mengdao Xing

Additive Manufacturing (AM) processes present challenges in monitoring and controlling material properties and process parameters, affecting production quality and defect detection. Machine Learning (ML) techniques offer a promising…

介观与纳米尺度物理 · 物理学 2026-05-15 Mohsen Asghari Ilani , Yaser Mike Banad

The detection of manufacturing errors is crucial in fabrication processes to ensure product quality and safety standards. Since many defects occur very rarely and their characteristics are mostly unknown a priori, their detection is still…

计算机视觉与模式识别 · 计算机科学 2020-08-31 Marco Rudolph , Bastian Wandt , Bodo Rosenhahn

Deep learning promises performant anomaly detection on time-variant datasets, but greatly suffers from low availability of suitable training datasets and frequently changing tasks. Deep transfer learning offers mitigation by letting…

机器学习 · 计算机科学 2021-06-10 Benjamin Maschler , Tim Knodel , Michael Weyrich

Detecting drifts in data is essential for machine learning applications, as changes in the statistics of processed data typically has a profound influence on the performance of trained models. Most of the available drift detection methods…

机器学习 · 计算机科学 2024-10-28 Andrea Castellani , Sebastian Schmitt , Barbara Hammer

Data-hunger and data-imbalance are two major pitfalls in many deep learning approaches. For example, on highly optimized production lines, defective samples are hardly acquired while non-defective samples come almost for free. The defects…

计算机视觉与模式识别 · 计算机科学 2023-02-17 Ruyu Wang , Sabrina Hoppe , Eduardo Monari , Marco F. Huber

Defect detection is a basic and essential task in automatic parts production, especially for automotive engine precision parts. In this paper, we propose a new idea to construct a deep convolutional network combining related knowledge of…

计算机视觉与模式识别 · 计算机科学 2018-10-30 Zhenshen Qu , Jianxiong Shen , Ruikun Li , Junyu Liu , Qiuyu Guan

Transfer learning plays a key role in modern data analysis when: (1) the target data are scarce but the source data are sufficient; (2) the distributions of the source and target data are heterogeneous. This paper develops an interpretable…

机器学习 · 统计学 2024-01-31 Shuo Shuo Liu

Industrial surface defect detection often suffers from limited defect samples, severe long-tailed distributions, and difficulties in accurately localizing subtle defects under complex backgrounds. To address these challenges, this paper…

人工智能 · 计算机科学 2026-04-22 Shuo Feng , Runlin Zhou , Yuyang Li , Guangcan Liu

Predicting the number of defects in a project is critical for project test managers to allocate budget, resources, and schedule for testing, support and maintenance efforts. Software Defect Prediction models predict the number of defects in…

软件工程 · 计算机科学 2023-06-16 Susmita Haldar , Luiz Fernando Capretz

This proposes a novel ensemble deep learning-based model to accurately classify, detect and localize different defect categories for aggressive pitches and thin resists (High NA applications).In particular, we train RetinaNet models using…

图像与视频处理 · 电气工程与系统科学 2022-06-29 Bappaditya Deya , Dipam Goswamif , Sandip Haldera , Kasem Khalilb , Philippe Leraya , Magdy A. Bayoumi