相关论文: Application of Convolutional Neural Network to TSO…

Defect detection is one of the most important yet challenging tasks in the quality control stage in the manufacturing sector. In this work, we introduce a Tensor Convolutional Neural Network (T-CNN) and examine its performance on a real…

Controlling defects in semiconductor processes is important for maintaining yield, improving production cost, and preventing time-dependent critical component failures. Electron beam-based imaging has been used as a tool to survey wafers in…

Controlling crystalline material defects is crucial, as they affect properties of the material that may be detrimental or beneficial for the final performance of a device. Defect analysis on the sub-nanometer scale is enabled by…

In this research work, we have demonstrated the application of Mask-RCNN (Regional Convolutional Neural Network), a deep-learning algorithm for computer vision and specifically object detection, to semiconductor defect inspection domain.…

Automated visual inspection in the semiconductor industry aims to detect and classify manufacturing defects utilizing modern image processing techniques. While an earliest possible detection of defect patterns allows quality control and…

Seam carving is a representative content-aware image retargeting approach to adjust the size of an image while preserving its visually prominent content. To maintain visually important content, seam-carving algorithms first calculate the…

Deep learning algorithms offer a powerful means to automatically analyze the content of medical images. However, many biological samples of interest are primarily transparent to visible light and contain features that are difficult to…

Visual defect assessment is a form of anomaly detection. This is very relevant in finding faults such as cracks and markings in various surface inspection tasks like pavement and automotive parts. The task involves detection of…

Recently, outstanding identification rates in image classification tasks were achieved by convolutional neural networks (CNNs). to use such skills, selective CNNs trained on a dataset of well-known images of metal surface defects captured…

Surface inspection systems are an important application domain for computer vision, as they are used for defect detection and classification in the manufacturing industry. Existing systems use hand-crafted features which require extensive…

The sensitivity of thin-film materials and devices to defects motivates extensive research into the optimization of film morphology. This research could be accelerated by automated experiments that characterize the response of film…

Object segmentation and structure localization are important steps in automated image analysis pipelines for microscopy images. We present a convolution neural network (CNN) based deep learning architecture for segmentation of objects in…

A growing need exists for efficient and accurate methods for detecting defects in semiconductor materials and devices. These defects can have a detrimental impact on the efficiency of the manufacturing process, because they cause critical…

In today's digital age, Convolutional Neural Networks (CNNs), a subset of Deep Learning (DL), are widely used for various computer vision tasks such as image classification, object detection, and image segmentation. There are numerous types…

State-of-the-art electron microscopes such as scanning electron microscopes (SEM), scanning transmission electron microscopes (STEM) and transmission electron microscopes (TEM) have become increasingly sophisticated. However, the quality of…

The recognition and classification of the diversity of materials that exist in the environment around us are a key visual competence that computer vision systems focus on in recent years. Understanding the identification of materials in…

Convolutional Neural Networks (CNN) have revolutionized perception for color images, and their application to sonar images has also obtained good results. But in general CNNs are difficult to train without a large dataset, need manual…

An important part of breast cancer staging is the assessment of the sentinel axillary node for early signs of tumor spreading. However, this assessment by pathologists is not always easy and retrospective surveys often requalify the status…

The rise of deep learning has introduced a transformative era in the field of image processing, particularly in the context of computed tomography. Deep learning has made a significant contribution to the field of industrial Computed…

Clients are increasingly looking for fast and effective means to quickly and frequently survey and communicate the condition of their buildings so that essential repairs and maintenance work can be done in a proactive and timely manner…