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Compressed sensing algorithms are used to decrease electron microscope scan time and electron beam exposure with minimal information loss. Following successful applications of deep learning to compressed sensing, we have developed a…

图像与视频处理 · 电气工程与系统科学 2020-05-21 Jeffrey M. Ede , Richard Beanland

Here a new microscopic method is proposed to image and characterize very thin samples like few-layer materials, organic molecules, and nanostructures with nanometer or sub-nanometer resolution using electron beams of energies lower than 20…

仪器与探测器 · 物理学 2016-01-06 Ing-Shouh Hwang

Despite decades of research, the ultimate goal of nanotechnology--top-down manipulation of individual atoms--has been directly achieved with only one technique: scanning probe microscopy. In this Review, we demonstrate that scanning…

We present an advanced scanning probe microscopy system enhanced with artificial intelligence (AI-SPM) designed for self-driving atomic-scale measurements. This system expertly identifies and manipulates atomic positions with high…

计算物理 · 物理学 2024-04-18 Zhuo Diao , Keiichi Ueda , Linfeng Hou , Fengxuan Li , Hayato Yamashita , Masayuki Abe

Advanced electron microscopy workflows require an ecosystem of microscope instruments and computing systems possibly located at different sites to conduct remotely steered and automated experiments. Current workflow executions involve…

In the Earth's magnetosphere, there are fewer than a dozen dedicated probes beyond low-Earth orbit making in-situ observations at any given time. As a result, we poorly understand its global structure and evolution, the mechanisms of its…

天体物理仪器与方法 · 物理学 2022-12-29 M. I. Sitnov , G. K. Stephens , V. G. Merkin , C. -P. Wang , D. Turner , K. Genestreti , M. Argall , T. Y. Chen , A. Y. Ukhorskiy , S. Wing , Y. -H. Liu

Artificial intelligence (AI) and machine learning have promised to revolutionize the way we live and work, and one of particularly promising areas for AI is image analysis. Nevertheless, many current AI applications focus on post-processing…

材料科学 · 物理学 2020-07-31 Boyuan Huang , Zhenghao Li , Jiangyu Li

Scanning probe microscopy (SPM) is a valuable technique by which one can investigate the physical characteristics of the surfaces of materials. However, its widespread use is hampered by the time-consuming nature of running an experiment…

仪器与探测器 · 物理学 2025-09-03 Nicholas J. Sullivan , Julio J. Valdés , Kirk H. Bevan , Peter Grutter

This paper presents a systematic solution for the intelligent recognition and automatic analysis of microscopy images. We developed a data engine that generates high-quality annotated datasets through a combination of the collection of…

图像与视频处理 · 电气工程与系统科学 2025-08-27 Yanhui Hong , Nan Wang , Zhiyi Xia , Haoyi Tao , Xi Fang , Yiming Li , Jiankun Wang , Peng Jin , Xiaochen Cai , Shengyu Li , Ziqi Chen , Zezhong Zhang , Guolin Ke , Linfeng Zhang

Optical microscopy is an indispensable tool in life sciences research, but conventional techniques require compromises between imaging parameters like speed, resolution, field-of-view, and phototoxicity. To overcome these limitations,…

定量方法 · 定量生物学 2024-04-01 Leonor Morgado , Estibaliz Gómez-de-Mariscal , Hannah S. Heil , Ricardo Henriques

The use of fast pixelated detectors and direct electron detection technology is revolutionising many aspects of scanning transmission electron microscopy (STEM). The widespread adoption of these new technologies is impeded by the technical…

s miniaturization of electrical and mechanical components used in modern technology progresses, there is an increasing need for high-throughput and low-cost micro-scale assembly techniques. Many current micro-assembly methods are serial in…

计算工程、金融与科学 · 计算机科学 2021-07-23 Tuo Zhou , Shih-Yuan Yu , Matthew Michaels , Fangzhou Du , Lawrence Kulinsky , Mohammad Abdullah Al Faruque

Scanning tunnelling microscopy (STM) is a powerful technique for imaging surfaces with atomic resolution, providing insight into physical and chemical processes at the level of single atoms and molecules. A regular task of STM image…

Nowadays, modern electron microscopes deliver images at atomic scale. The precise atomic structure encodes information about material properties. Thus, an important ingredient in the image analysis is to locate the centers of the atoms…

计算机视觉与模式识别 · 计算机科学 2017-09-13 Benjamin Berkels , Benedikt Wirth

Optics is foundational to research in many areas of science and engineering, including nanophotonics, quantum information, materials science, biomedical imaging, and metrology. However, the design, assembly, and alignment of optical…

Fine-grained sparsity promises higher parametric capacity without proportional per-token compute, but often suffers from training instability, load balancing, and communication overhead. We introduce STEM (Scaling Transformers with…

Analytical electron microscopy and spectroscopy of biological specimens, polymers, and other beam sensitive materials has been a challenging area due to irradiation damage. There is a pressing need to develop novel imaging and spectroscopic…

Microscopy, in particular scanning probe and electron microscopy, has been pivotal in improving our understanding of structure-function relationships at the nanoscale and is by now ubiquitous in most research characterization labs and…

We focus on the potential possibilities for supporting Scanning Probe Microscopy measurements, emphasizing the application of Artificial Intelligence, especially Machine Learning as well as quantum computing. It turned out that Artificial…

神经元与认知 · 定量生物学 2024-07-01 Agnieszka Pregowska , Agata Roszkiewicz , Magdalena Osial , Michael Giersig

Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM) is a powerful technique for high-resolution and high-precision materials characterization at multiple length scales, including the characterization of beam-sensitive…

应用物理 · 物理学 2023-08-11 Hsu-Chih Ni , Renliang Yuan , Jiong Zhang , Jian-Min Zuo