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Change point detection is a crucial aspect of analyzing time series data, as the presence of a change point indicates an abrupt and significant change in the process generating the data. While many algorithms for the problem of change point…

机器学习 · 计算机科学 2023-05-23 Mario Krause

This paper presents a challenging computer vision task, namely the detection of generic components on a PCB, and a novel set of deep-learning methods that are able to jointly leverage the appearance of individual components and the…

计算机视觉与模式识别 · 计算机科学 2018-11-21 Chia-Wen Kuo , Jacob Ashmore , David Huggins , Zsolt Kira

Controlling crystalline material defects is crucial, as they affect properties of the material that may be detrimental or beneficial for the final performance of a device. Defect analysis on the sub-nanometer scale is enabled by…

材料科学 · 物理学 2021-06-03 Nik Dennler , Antonio Foncubierta-Rodriguez , Titus Neupert , Marilyne Sousa

Automated visual inspection in the semiconductor industry aims to detect and classify manufacturing defects utilizing modern image processing techniques. While an earliest possible detection of defect patterns allows quality control and…

机器学习 · 计算机科学 2024-06-11 Tobias Schlosser , Frederik Beuth , Michael Friedrich , Danny Kowerko

Remote Sensing Change Detection (RS-CD) aims to detect relevant changes from Multi-Temporal Remote Sensing Images (MT-RSIs), which aids in various RS applications such as land cover, land use, human development analysis, and disaster…

计算机视觉与模式识别 · 计算机科学 2023-03-17 Wele Gedara Chaminda Bandara , Vishal M. Patel

In industrial defect segmentation tasks, while pixel accuracy and Intersection over Union (IoU) are commonly employed metrics to assess segmentation performance, the output consistency (also referred to equivalence) of the model is often…

计算机视觉与模式识别 · 计算机科学 2023-10-02 Zhen Qu , Xian Tao , Fei Shen , Zhengtao Zhang , Tao Li

A common source of defects in manufacturing miniature Printed Circuits Boards (PCB) is the attachment of silicon die or other wire bondable components on a Liquid Crystal Polymer (LCP) substrate. Typically, a conductive glue is dispensed…

Surface defect inspection based on machine vision is often affected by uneven illumination. In order to improve the inspection rate of surface defects inspection under uneven illumination condition, this paper proposes a method for…

计算机视觉与模式识别 · 计算机科学 2023-07-18 Hao Wu , Yulong Liu , Wenbin Gao , Xiangrong Xu

Industrial surface defect detection often suffers from limited defect samples, severe long-tailed distributions, and difficulties in accurately localizing subtle defects under complex backgrounds. To address these challenges, this paper…

人工智能 · 计算机科学 2026-04-22 Shuo Feng , Runlin Zhou , Yuyang Li , Guangcan Liu

Deep learning has been constantly improving in recent years and a significant number of researchers have devoted themselves to the research of defect detection algorithms. Detection and recognition of small and complex targets is still a…

计算机视觉与模式识别 · 计算机科学 2024-06-24 Siddiqui Muhammad Yasir , Hyunsik Ahn

We present a novel approach for inspecting variable data prints (VDP) with an ultra-low false alarm rate (0.005%) and potential applicability to other real-world problems. The system is based on a comparison between two images: a reference…

计算机视觉与模式识别 · 计算机科学 2020-01-14 Oren Haik , Oded Perry , Eli Chen , Peter Klammer

Early detection of incipient faults is of vital importance to reducing maintenance costs, saving energy, and enhancing occupant comfort in buildings. Popular supervised learning models such as deep neural networks are considered promising…

Photon counting detectors (PCDs) offer promising advancements in computed tomography (CT) imaging by enabling the quantification and 3D imaging of contrast agents and tissue types through multi-energy projections. However, the accuracy of…

医学物理 · 物理学 2023-10-18 Juan C. R. Luna , Mini Das

Visual anomaly detection plays a significant role in the development of industrial automatic product quality inspection. As a result of the utmost imbalance in the amount of normal and abnormal data, growing attention has been given to…

计算机视觉与模式识别 · 计算机科学 2023-01-16 Wei Luo , Haiming Yao , Wenyong Yu

Optical inspection of 1191 silicon micro-strip sensors was performed using a custom made optical inspection setup, employing a machine-learning based approach for the defect analysis and subsequent quality assurance. Furthermore,…

仪器与探测器 · 物理学 2021-12-08 E. Lavrik , M. Shiroya , H. R. Schmidt , A. Toia , J. M. Heuser

The rise of deep learning has introduced a transformative era in the field of image processing, particularly in the context of computed tomography. Deep learning has made a significant contribution to the field of industrial Computed…

计算机视觉与模式识别 · 计算机科学 2024-01-30 Yuzhong Zhou , Linda-Sophie Schneider , Fuxin Fan , Andreas Maier

Surface inspection systems are an important application domain for computer vision, as they are used for defect detection and classification in the manufacturing industry. Existing systems use hand-crafted features which require extensive…

图像与视频处理 · 电气工程与系统科学 2019-04-10 Selim Arikan , Kiran Varanasi , Didier Stricker

In this research work, we have demonstrated the application of Mask-RCNN (Regional Convolutional Neural Network), a deep-learning algorithm for computer vision and specifically object detection, to semiconductor defect inspection domain.…

计算机视觉与模式识别 · 计算机科学 2022-11-07 Bappaditya Dey , Enrique Dehaerne , Kasem Khalil , Sandip Halder , Philippe Leray , Magdy A. Bayoumi

Detecting and evaluating surface coating defects is important for marine vessel maintenance. Currently, the assessment is carried out manually by qualified inspectors using international standards and their own experience. Automating the…

计算机视觉与模式识别 · 计算机科学 2022-03-21 Li Yu , Kareem Metwaly , James Z. Wang , Vishal Monga

Deep learning techniques have achieved great success in remote sensing image change detection. Most of them are supervised techniques, which usually require large amounts of training data and are limited to a particular application.…

图像与视频处理 · 电气工程与系统科学 2021-10-11 Yuxing Chen , Lorenzo Bruzzone