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Surface inspection systems are an important application domain for computer vision, as they are used for defect detection and classification in the manufacturing industry. Existing systems use hand-crafted features which require extensive…

图像与视频处理 · 电气工程与系统科学 2019-04-10 Selim Arikan , Kiran Varanasi , Didier Stricker

Deep learning models are widely used across computer vision and other domains. When working on the model induction, selecting the right architecture for a given dataset often relies on repetitive trial-and-error procedures. This procedure…

机器学习 · 计算机科学 2026-01-06 Yen-Chia Chen , Hsing-Kuo Pao , Hanjuan Huang

Automatic image-based food recognition is a particularly challenging task. Traditional image analysis approaches have achieved low classification accuracy in the past, whereas deep learning approaches enabled the identification of food…

计算机视觉与模式识别 · 计算机科学 2020-04-09 Chairi Kiourt , George Pavlidis , Stella Markantonatou

Like any field of empirical science, AI may be approached axiomatically. We formulate requirements for a general-purpose, human-level AI system in terms of postulates. We review the methodology of deep learning, examining the explicit and…

人工智能 · 计算机科学 2018-06-26 Eray Özkural

Model checking, a formal verification technique, ensures systems meet predefined requirements, playing a crucial role in minimizing errors and enhancing quality during development. This paper introduces a novel hybrid framework integrating…

计算机视觉与模式识别 · 计算机科学 2025-05-01 Elhoucine Elfatimi , Lahcen El Fatimi , Hanifa Bouchaneb

In response to the growing popularity of Machine Learning (ML) techniques to solve problems in various industries, various malicious groups have started to target such techniques in their attack plan. However, as ML models are constantly…

密码学与安全 · 计算机科学 2025-03-25 Shahinul Hoque , Farhin Farhad Riya , Yingyuan Yang , Jinyuan Sun

The incorporation of advanced sensors and machine learning techniques has enabled modern manufacturing enterprises to perform data-driven classification-based anomaly detection based on the sensor data collected in manufacturing processes.…

机器学习 · 计算机科学 2024-11-19 Yuxuan Li , Tianxin Xie , Chenang Liu , Zhangyue Shi

Object Detection is the task of classification and localization of objects in an image or video. It has gained prominence in recent years due to its widespread applications. This article surveys recent developments in deep learning based…

计算机视觉与模式识别 · 计算机科学 2021-05-13 Syed Sahil Abbas Zaidi , Mohammad Samar Ansari , Asra Aslam , Nadia Kanwal , Mamoona Asghar , Brian Lee

The ability to develop or evolve software or software-based systems/services with defined and guaranteed quality in a predictable way is becoming increasingly important. Essential - though not exclusive - prerequisites for this are the…

Object perception is a fundamental sub-field of Computer Vision, covering a multitude of individual areas and having contributed high-impact results. While Machine Learning has been traditionally applied to address related problems, recent…

计算机视觉与模式识别 · 计算机科学 2020-03-18 Filippos Gouidis , Alexandros Vassiliades , Theodore Patkos , Antonis Argyros , Nick Bassiliades , Dimitris Plexousakis

As an integral part of contemporary manufacturing, monitoring systems obtain valuable information during machining to oversee the condition of both the process and the machine. Recently, diverse algorithms have been employed to detect tool…

机器学习 · 计算机科学 2024-10-10 Zongshuo Li , Markus Meurer , Thomas Bergs

Face image quality is an important factor in facial recognition systems as its verification and recognition accuracy is highly dependent on the quality of image presented. Rejecting low quality images can significantly increase the accuracy…

计算机视觉与模式识别 · 计算机科学 2018-11-13 Vishal Agarwal

Internet of Things (IoT) has brought along immense benefits to our daily lives encompassing a diverse range of application domains that we regularly interact with, ranging from healthcare automation to transport and smart environments.…

密码学与安全 · 计算机科学 2020-07-21 Mengmeng Ge , Naeem Firdous Syed , Xiping Fu , Zubair Baig , Antonio Robles-Kelly

This paper focuses on the analysis of the application effectiveness of the integration of deep learning and computer vision technologies. Deep learning achieves a historic breakthrough by constructing hierarchical neural networks, enabling…

计算机视觉与模式识别 · 计算机科学 2023-12-21 Bo Liu , Liqiang Yu , Chang Che , Qunwei Lin , Hao Hu , Xinyu Zhao

Ensuring fairness in machine learning is a critical and challenging task, as biased data representations often lead to unfair predictions. To address this, we propose Deep Fair Learning, a framework that integrates nonlinear sufficient…

机器学习 · 统计学 2025-04-10 Enze Shi , Linglong Kong , Bei Jiang

This paper presents a robust deep learning framework developed to detect respiratory diseases from recordings of respiratory sounds. The complete detection process firstly involves front end feature extraction where recordings are…

声音 · 计算机科学 2020-02-11 Lam Pham , Ian McLoughlin , Huy Phan , Minh Tran , Truc Nguyen , Ramaswamy Palaniappan

In this work we present a system based on a Deep Learning approach, by using a Convolutional Neural Network, capable of classifying protein chains of amino acids based on the protein description contained in the Protein Data Bank. Each…

机器学习 · 计算机科学 2021-11-04 Damiano Perri , Marco Simonetti , Andrea Lombardi , Noelia Faginas-Lago , Osvaldo Gervasi

We propose a novel, efficient, modular and scalable framework for content based visual media retrieval systems by leveraging the power of Deep Learning which is flexible to work both for images and videos conjointly and we also introduce an…

机器学习 · 计算机科学 2021-05-19 Ambareesh Ravi , Amith Nandakumar

The future success of the Navy will depend, in part, on artificial intelligence. In practice, many artificially intelligent algorithms, and in particular deep learning models, rely on continual learning to maintain performance in dynamic…

机器学习 · 计算机科学 2023-11-21 Ari Goodman , Ryan O'Shea , Noam Hirschorn , Hubert Chrostowski

Quality management in semiconductor manufacturing often relies on template matching with known golden standards. For Indium-Phosphide (InP) multi-project wafer manufacturing, low production scale and high design variability lead to such…

计算机视觉与模式识别 · 计算机科学 2025-06-13 Emílio Dolgener Cantú , Rolf Klemens Wittmann , Oliver Abdeen , Patrick Wagner , Wojciech Samek , Moritz Baier , Sebastian Lapuschkin