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Industrial Anomaly Detection (IAD) is critical for quality control, but existing methods struggle with subtle, geometric defects. Standard 2D (RGB) images are sensitive to texture and lighting but often miss fine geometric anomalies. While…

计算机视觉与模式识别 · 计算机科学 2026-05-11 Wenbing Zhu , Jianing Liang , Linjie Cheng , Yurui Pan , Zhuhao Chen , Qingwang Yan , Yudong Cheng , Jianghui Zhang , Mingmin Chi , Bo Peng

A growing need exists for efficient and accurate methods for detecting defects in semiconductor materials and devices. These defects can have a detrimental impact on the efficiency of the manufacturing process, because they cause critical…

计算机视觉与模式识别 · 计算机科学 2023-08-21 Thibault Lechien , Enrique Dehaerne , Bappaditya Dey , Victor Blanco , Sandip Halder , Stefan De Gendt , Wannes Meert

Mass-produced optical lenses often exhibit defects that alter their scattering properties and compromise quality standards. Manual inspection is usually adopted to detect defects, but it is not recommended due to low accuracy, high error…

计算机视觉与模式识别 · 计算机科学 2025-02-12 Habib Yaseen

A current trend in industries such as semiconductors and foundry is to shift their visual inspection processes to Automatic Visual Inspection (AVI) systems, to reduce their costs, mistakes, and dependency on human experts. This paper…

计算机视觉与模式识别 · 计算机科学 2021-09-22 Masoud Jalayer , Reza Jalayer , Amin Kaboli , Carlotta Orsenigo , Carlo Vercellis

Anomaly detection from images captured using camera sensors is one of the mainstream applications at the industrial level. Particularly, it maintains the quality and optimizes the efficiency in production processes across diverse industrial…

计算机视觉与模式识别 · 计算机科学 2025-01-22 Abdelrahman Alzarooni , Ehtesham Iqbal , Samee Ullah Khan , Sajid Javed , Brain Moyo , Yusra Abdulrahman

Within (semi-)automated visual industrial inspection, learning-based approaches for assessing visual defects, including deep neural networks, enable the processing of otherwise small defect patterns in pixel size on high-resolution imagery.…

计算机视觉与模式识别 · 计算机科学 2023-11-08 André Luiz Buarque Vieira e Silva , Francisco Simões , Danny Kowerko , Tobias Schlosser , Felipe Battisti , Veronica Teichrieb

Identifying defects and anomalies in industrial products is a critical quality control task. Traditional manual inspection methods are slow, subjective, and error-prone. In this work, we propose a novel zero-shot training-free approach for…

计算机视觉与模式识别 · 计算机科学 2024-12-02 Tsun-Hin Cheung , Ka-Chun Fung , Songjiang Lai , Kwan-Ho Lin , Vincent Ng , Kin-Man Lam

The development of computer vision and in-situ monitoring using visual sensors allows the collection of large datasets from the additive manufacturing (AM) process. Such datasets could be used with machine learning techniques to improve the…

计算机视觉与模式识别 · 计算机科学 2023-09-06 Xiao Liu , Alessandra Mileo , Alan F. Smeaton

Visual defect assessment is a form of anomaly detection. This is very relevant in finding faults such as cracks and markings in various surface inspection tasks like pavement and automotive parts. The task involves detection of…

计算机视觉与模式识别 · 计算机科学 2019-05-31 Manpreet Singh Minhas , John Zelek

Automatic image anomaly detection is important for quality inspection in the manufacturing industry. The usual unsupervised anomaly detection approach is to train a model for each object class using a dataset of normal samples. However, a…

计算机视觉与模式识别 · 计算机科学 2024-09-04 Yuanwei Li , Elizaveta Ivanova , Martins Bruveris

Industrial diagrams such as piping and instrumentation diagrams (P&IDs) are essential for the design, operation, and maintenance of industrial plants. Converting these diagrams into digital form is an important step toward building digital…

计算机视觉与模式识别 · 计算机科学 2025-10-07 Sanjukta Ghosh

Topological defects play a key role in the structures and dynamics of liquid crystals (LCs) and other ordered systems. There is a recent interest in studying defects in different biological systems with distinct textures. However, a robust…

软凝聚态物质 · 物理学 2025-01-20 Haijie Ren , Weiqiang Wang , Wentao Tang , Rui Zhang

This work is addressing the problem of defect anomaly detection based on a clean reference image. Specifically, we focus on SEM semiconductor defects in addition to several natural image anomalies. There are well-known methods to create a…

计算机视觉与模式识别 · 计算机科学 2023-03-22 Nati Ofir , Yotam Ben Shoshan , Ran Badanes , Boris Sherman

Industry 4.0 will make manufacturing processes smarter but this smartness requires more environmental awareness, which in case of Industrial Internet of Things, is realized by the help of sensors. This article is about industrial…

Unsupervised anomaly in industry has been a concerning topic and a stepping stone for high performance industrial automation process. The vast majority of industry-oriented methods focus on learning from good samples to detect anomaly…

计算机视觉与模式识别 · 计算机科学 2023-06-21 Simon Thomine , Hichem Snoussi , Mahmoud Soua

The industry increasingly relies on deep learning (DL) technology for manufacturing inspections, which are challenging to automate with rule-based machine vision algorithms. DL-powered inspection systems derive defect patterns from labeled…

机器学习 · 计算机科学 2024-09-17 Altaf Allah Abbassi , Houssem Ben Braiek , Foutse Khomh , Thomas Reid

Visual sensory anomaly detection (AD) is an essential problem in computer vision, which is gaining momentum recently thanks to the development of AI for good. Compared with semantic anomaly detection which detects anomaly at the label level…

计算机视觉与模式识别 · 计算机科学 2022-02-16 Xi Jiang , Guoyang Xie , Jinbao Wang , Yong Liu , Chengjie Wang , Feng Zheng , Yaochu Jin

The identification and removal of systematic errors in object detectors can be a prerequisite for their deployment in safety-critical applications like automated driving and robotics. Such systematic errors can for instance occur under very…

计算机视觉与模式识别 · 计算机科学 2023-09-26 Valentyn Boreiko , Matthias Hein , Jan Hendrik Metzen

Maintaining sewer systems in large cities is important, but also time and effort consuming, because visual inspections are currently done manually. To reduce the amount of aforementioned manual work, defects within sewer pipes should be…

计算机视觉与模式识别 · 计算机科学 2024-04-10 Bach Ha , Birgit Schalter , Laura White , Joachim Koehler

Unsupervised anomaly detection and localization is crucial to the practical application when collecting and labeling sufficient anomaly data is infeasible. Most existing representation-based approaches extract normal image features with a…

计算机视觉与模式识别 · 计算机科学 2021-11-17 Jiawei Yu , Ye Zheng , Xiang Wang , Wei Li , Yushuang Wu , Rui Zhao , Liwei Wu