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Atomic force microscopy (AFM) with molecule-functionalized tips has emerged as the primary experimental technique for probing the atomic structure of organic molecules on surfaces. Most experiments have been limited to nearly planar…

The aim of this article is to provide a complete analysis of the behavior of a noncontact atomic force microscope (NC-AFM). We start with a review of the equations of motion of a tip interacting with a surface in which the stability…

原子与分子团簇 · 物理学 2016-08-16 Gérard Couturier , Rodolphe Boisgard , Laurent Nony , Jean-Pierre Aimé

Atomic force spectroscopy and microscopy (AFM) are invaluable tools to characterize nanostructures and biological systems. Most experiments, including state-of-the-art images of molecular bonds, are achieved by driving probes at their…

Dynamics of dissipation of a local phonon distribution to the substrate is a key issue in friction between sliding surfaces as well as in boundary lubrication. We consider a model system consisting of an excited nano-particle which is…

其他凝聚态物理 · 物理学 2009-11-13 Haldun Sevinçli , Soma Mukhopadhyay , R. Tugrul Senger , Salim Ciraci

An expression describing the controlling parameters involved in short range nanoscale dissipation is proposed and supported by simulations and experimental findings. The expression is deconstructed into the geometrical, dynamic, chemical…

介观与纳米尺度物理 · 物理学 2014-01-28 Sergio Santos , Carlo A. Amadei , Tzu Chieh Tang , Victor Barcons , Matteo Chiesa

Micro- and nanomechanical resonators are emerging as promising platforms for quantum technologies, precision sensors and fundamental science experiments. To utilize these devices for force sensing or quantum optomechanics, they must be…

Atomic force microscopy (AFM) can be used to characterise several aspects of the surface degradation and reinforcement mechanisms of zirconia based ceramics, such as crack propagation, martensitic relief formation, grains pull-out and…

Theory predicts that two-dimensional (2D) materials may only exist in the presence of out-ofplane deformations on atomic length scales, frequently referred to as ripples. While such ripples can be detected via electron microscopy, their…

应用物理 · 物理学 2020-09-15 Omur E. Dagdeviren , Ogulcan Acikgoz , Peter Grutter , Mehmet Z. Baykara

Atomically-resolved imaging and force measurements using the atomic force microscope (AFM) are performed most commonly in a frequency-modulation (FM) mode. This has led to spectacular results, including direct observation of the atomic…

介观与纳米尺度物理 · 物理学 2018-12-26 John E. Sader , Barry D. Hughes , Ferdinand Huber , Franz J. Giessibl

Intercalation of two dimensional materials, particularly transition metal dichalcogenides, is a noninvasive way to modify electronic, optical and structural properties of these materials. However, research of these atomic-scale phenomena…

Numerical modeling of viscoelastic properties is critical to developing the structure-property relationship of polymer nanocomposites. While it is recognized that the altered polymer region near filler particles, the interphase,…

We review the progress in the spatial resolution of atomic force microscopy (AFM) in vacuum. After an introduction of the basic principle and a conceptual comparison to scanning tunneling microscopy, the main challenges of AFM and the…

材料科学 · 物理学 2007-05-23 Franz J. Giessibl

The force between two interacting particles as a function of distance is one of the most fundamental curves in science. In this regard, Atomic Force Microscopy (AFM) represents the most powerful tool in nanoscience but with severe limits…

介观与纳米尺度物理 · 物理学 2015-11-24 Mario S. Rodrigues , Luca Costa , Joel Chevrier , Fabio Comin

The functional properties of many technological surfaces in biotechnology, electronics, and mechanical engineering depend to a large degree on the individual features of their nanoscale surface texture, which in turn are a function of the…

Atomic Force Microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity…

介观与纳米尺度物理 · 物理学 2017-02-01 Nina Balke , Stephen Jesse , Ben Carmichael , M. Baris Okatan , Ivan I. Kravchenko , Sergei V. Kalinin , Alexander Tselev

Atomic Force Microscopy (AFM) has a great potential as a tool to characterize mechanical and morphological properties of living cells; these properties have been shown to correlate with cells' fate and patho-physiological state in view of…

软凝聚态物质 · 物理学 2017-06-21 Luca Puricelli , Massimiliano Galluzzi , Carsten Schulte , Alessandro Podestà , Paolo Milani

Conventional dynamic atomic force microscopy (AFM) can be extended to bimodal and multimodal AFM in which the cantilever is simultaneously excited at two ore more resonance frequencies. Such excitation schemes result in one additional…

介观与纳米尺度物理 · 物理学 2014-11-19 Daniel Forchheimer , Stanislav S. Borysov , Daniel Platz , David B. Haviland

Atomic Force Microscopy (AFM) combined with electrical modes provides a powerful contactless approach to characterize material electrical properties at the nanoscale. However, conventional electrostatic models often overlook dynamic charge…

介观与纳米尺度物理 · 物理学 2025-08-26 Mario Navarro-Rodriguez , Paul Philip Schmidt , Regina Hoffmann-Vogel , Andres M. Somoza , Elisa Palacios-Lidon

Recently, using an Atomic Force Microscope and a single cantilever excited at different frequencies it was shown that water nanomeniscus can exhibit a transition in mechanical responses when submitted to stimuli above few tens of kHz. The…

软凝聚态物质 · 物理学 2016-09-26 Simon Carpentier , Mario S. Rodrigues , Luca Costa , Miguel V. VItorino , Joel Chevrier

Measuring the mechanical response of liquid interfaces without direct contact remains a major experimental challenge, particularly in liquid-liquid systems where no solid reference exists. Here, we develop a frequency-modulation atomic…

软凝聚态物质 · 物理学 2026-05-29 Lucie Corral , Christian Curtil , Medhi Lagaize , Marc Leonetti , Hubert R. Klein