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In computer chip manufacturing, the study of etch patterns on silicon wafers, or metrology, occurs on the nano-scale and is therefore subject to large variation from small, yet significant, perturbations in the manufacturing environment. An…

机器学习 · 计算机科学 2019-10-23 Jack Kenney , John Valcore , Scott Riggs , Edward Rietman

In this paper we consider the problem of estimating a dense depth map from a set of sparse LiDAR points. We use techniques from compressed sensing and the recently developed Alternating Direction Neural Networks (ADNNs) to create a deep…

计算机视觉与模式识别 · 计算机科学 2018-03-28 Nathaniel Chodosh , Chaoyang Wang , Simon Lucey

Localizing more sources than sensors with a sparse linear array (SLA) has long relied on minimizing a distance between two covariance matrices and recent algorithms often utilize semidefinite programming (SDP). Although deep neural network…

信号处理 · 电气工程与系统科学 2025-03-11 Kuan-Lin Chen , Bhaskar D. Rao

Three dimensional electron back-scattered diffraction (EBSD) microscopy is a critical tool in many applications in materials science, yet its data quality can fluctuate greatly during the arduous collection process, particularly via…

计算机视觉与模式识别 · 计算机科学 2023-08-21 Harry Dong , Sean Donegan , Megna Shah , Yuejie Chi

We address the problem of compressed sensing using a deep generative prior model and consider both linear and learned nonlinear sensing mechanisms, where the nonlinear one involves either a fully connected neural network or a convolutional…

机器学习 · 计算机科学 2021-05-26 Vinayak Killedar , Praveen Kumar Pokala , Chandra Sekhar Seelamantula

Single-Image Super-Resolution can support robotic tasks in environments where a reliable visual stream is required to monitor the mission, handle teleoperation or study relevant visual details. In this work, we propose an efficient…

图像与视频处理 · 电气工程与系统科学 2023-05-10 Simone Angarano , Francesco Salvetti , Mauro Martini , Marcello Chiaberge

The concept of compressive sensing was recently proposed to significantly reduce the electron dose in scanning transmission electron microscopy (STEM) while still maintaining the main features in the image. Here, an experimental setup based…

仪器与探测器 · 物理学 2016-03-23 Armand Béché , Bart Goris , Bert Freitag , Jo Verbeeck

Behavioral patterns captured in embeddings learned from interaction data are pivotal across various stages of production recommender systems. However, in the initial retrieval stage, practitioners face an inherent tradeoff between embedding…

信息检索 · 计算机科学 2026-02-11 Vojtěch Vančura , Martin Spišák , Rodrigo Alves , Ladislav Peška

Deep metric learning aims to construct an embedding space where samples of the same class are close to each other, while samples of different classes are far away from each other. Most existing deep metric learning methods attempt to…

计算机视觉与模式识别 · 计算机科学 2023-04-24 Liu Pingping , Liu Zetong , Lang Yijun , Zhou Qiuzhan , Li Qingliang

Recent advances in image-level self-supervised learning (SSL) have made significant progress, yet learning dense representations for patches remains challenging. Mainstream methods encounter an over-dispersion phenomenon that patches from…

计算机视觉与模式识别 · 计算机科学 2025-09-12 Peisong Wen , Qianqian Xu , Siran Dai , Runmin Cong , Qingming Huang

Light field imaging is limited in its computational processing demands of high sampling for both spatial and angular dimensions. Single-shot light field cameras sacrifice spatial resolution to sample angular viewpoints, typically by…

计算机视觉与模式识别 · 计算机科学 2018-02-07 Mayank Gupta , Arjun Jauhari , Kuldeep Kulkarni , Suren Jayasuriya , Alyosha Molnar , Pavan Turaga

Deep neural networks have achieved substantial achievements in several computer vision areas, but have vulnerabilities that are often fooled by adversarial examples that are not recognized by humans. This is an important issue for security…

计算机视觉与模式识别 · 计算机科学 2021-01-29 Hakmin Lee , Hong Joo Lee , Seong Tae Kim , Yong Man Ro

In the application of machine learning to remote sensing, labeled data is often scarce or expensive, which impedes the training of powerful models like deep convolutional neural networks. Although unlabeled data is abundant, recent…

计算机视觉与模式识别 · 计算机科学 2021-08-12 Aidan M. Swope , Xander H. Rudelis , Kyle T. Story

While Graph Neural Networks (GNNs) are powerful models for learning representations on graphs, most state-of-the-art models do not have significant accuracy gain beyond two to three layers. Deep GNNs fundamentally need to address: 1).…

Support estimation (SE) of a sparse signal refers to finding the location indices of the non-zero elements in a sparse representation. Most of the traditional approaches dealing with SE problem are iterative algorithms based on greedy…

信号处理 · 电气工程与系统科学 2026-05-06 Mehmet Yamac , Mete Ahishali , Serkan Kiranyaz , Moncef Gabbouj

Experimental protocols at synchrotron light sources typically process and validate data only after an experiment has completed, which can lead to undetected errors and cannot enable online steering. Real-time data analysis can enable both…

图像与视频处理 · 电气工程与系统科学 2019-10-10 Zhengchun Liu , Tekin Bicer , Rajkumar Kettimuthu , Ian Foster

Deep metric learning aims to learn embeddings that contain semantic similarity information among data points. To learn better embeddings, methods to generate synthetic hard samples have been proposed. Existing methods of synthetic hard…

计算机视觉与模式识别 · 计算机科学 2020-04-24 Geonmo Gu , Byungsoo Ko

Recently, self-supervised learning (SSL) has achieved tremendous success in learning image representation. Despite the empirical success, most self-supervised learning methods are rather "inefficient" learners, typically taking hundreds of…

计算机视觉与模式识别 · 计算机科学 2023-04-11 Shengbang Tong , Yubei Chen , Yi Ma , Yann Lecun

Ultrasound images are commonly formed by sequential acquisition of beam-steered scan-lines. Minimizing the number of required scan-lines can significantly enhance frame rate, field of view, energy efficiency, and data transfer speeds.…

图像与视频处理 · 电气工程与系统科学 2025-01-08 Simon W. Penninga , Hans van Gorp , Ruud J. G. van Sloun

We develop a novel algorithm for characterizing Deep Sub-Electron Read Noise (DSERN) image sensors. This algorithm is able to simultaneously compute maximum likelihood estimates of quanta exposure, conversion gain, bias, and read noise of…

仪器与探测器 · 物理学 2023-06-29 Aaron Hendrickson , David P. Haefner