中文
相关论文

相关论文: Quantitative analysis of spectroscopic Low Energy …

200 篇论文

Scanning Transmission Electron Microscopy (STEM) coupled with Electron Energy Loss Spectroscopy (EELS) presents a powerful platform for detailed material characterization via rich imaging and spectroscopic data. Modern electron microscopes…

仪器与探测器 · 物理学 2024-06-18 Utkarsh Pratiush , Austin Houston , Sergei V Kalinin , Gerd Duscher

Extreme learning machine (ELM) as a neural network algorithm has shown its good performance, such as fast speed, simple structure etc, but also, weak robustness is an unavoidable defect in original ELM for blended data. We present a new…

机器学习 · 计算机科学 2014-09-24 Bo Han , Bo He , Rui Nian , Mengmeng Ma , Shujing Zhang , Minghui Li , Amaury Lendasse

Instrumentation developments in electron energy-loss spectroscopy (EELS) in the scanning transmission electron microscope (STEM) one decade ago paved the way for combining milli-electronvolt energy resolution in spectroscopy with…

介观与纳米尺度物理 · 物理学 2024-10-15 Benedikt Haas , Christoph T. Koch , Peter Rez

We explore how to mitigate the clustering distortions in Lyman-$\alpha$ emitters (LAEs) samples caused by the miss-identification of the Lyman-$\alpha$ (Ly$\alpha$) wavelength in their Ly$\alpha$ line profiles. We use the Ly$\alpha$ line…

Dual-energy computed tomography (DECT) enables material-specific imaging through acquisitions at two different X-ray energy spectra. Material decomposition from DECT data is an ill-posed inverse problem that is highly sensitive to noise…

Perhaps surprisingly, the total electron microscopy (EM) data collected to date is less than a cubic millimeter. Consequently, there is an enormous demand in the materials and biological sciences to image at greater speed and lower dosage,…

计算机视觉与模式识别 · 计算机科学 2016-12-06 Suhas Sreehari , S. V. Venkatakrishnan , Katherine L. Bouman , Jeffrey P. Simmons , Lawrence F. Drummy , Charles A. Bouman

Analytical electron microscopy and spectroscopy of biological specimens, polymers, and other beam sensitive materials has been a challenging area due to irradiation damage. There is a pressing need to develop novel imaging and spectroscopic…

The ability to characterize the color content of natural imagery is an important application of image processing. The pixel by pixel coloring of images may be viewed naturally as points in color space, and the inherent structure and…

几何拓扑 · 数学 2012-02-21 Lori Ziegelmeier , Michael Kirby , Chris Peterson

Cryo-electron microscopy (EM) single particle reconstruction is an entirely general technique for 3D structure determination of macromolecular complexes. However, because the images are taken at low electron dose, it is extremely hard to…

计算机视觉与模式识别 · 计算机科学 2019-04-17 Yifeng Fan , Zhizhen Zhao

Nowadays, modern electron microscopes deliver images at atomic scale. The precise atomic structure encodes information about material properties. Thus, an important ingredient in the image analysis is to locate the centers of the atoms…

计算机视觉与模式识别 · 计算机科学 2017-09-13 Benjamin Berkels , Benedikt Wirth

The robust approach for real-time analysis of the scanning transmission electron microscopy (STEM) data streams, based on the ensemble learning and iterative training (ELIT) of deep convolutional neural networks, is implemented on an…

A simple method is proposed for inclusion of inelastic effects (electron absorption) in computations of low-energy electron reflectivity (LEER) spectra. The theoretical spectra are formulated by matching of electron wavefunctions obtained…

介观与纳米尺度物理 · 物理学 2023-05-03 Qin Gao , P. C. Mende , M. Widom , R. M. Feenstra

We present an absolute extraction method of optical constants of metal from the measured reflection electron energy loss (REELS) spectra by using the recently developed reverse Monte Carlo (RMC) technique. The method is based on a direct…

材料科学 · 物理学 2017-05-24 H. Xu , B. Da , J. Toth , K. Tokesi , Z. J. Ding

Reliable quantitative analysis in scanning (transmission) electron microscopy (S(T)EM) is often hindered by image drift during long-duration spectral mapping for elemental analysis or for various material functions. We here present…

仪器与探测器 · 物理学 2026-04-22 Zac Thollar , Kanto Maeda , Tetsuya Kubota , Taka-aki Yano , Qiwen Tan , Takumi Sannomiya

The scanning electron microscope (SEM) produces an image of a sample by scanning it with a focused beam of electrons. The electrons interact with the atoms in the sample, which emit secondary electrons that contain information about the…

计算机视觉与模式识别 · 计算机科学 2017-09-08 Shahar Tsiper , Or Dicker , Idan Kaizerman , Zeev Zohar , Mordechai Segev , Yonina C. Eldar

Characterisation of rare microstructural features in scanning electron microscopy (SEM) requires imaging large areas at high resolution. This leads to prohibitively long acquisition times. We present an open-source Python framework that…

In this article, a new scanning electron microscopy (SEM) image composition technique is described, which can significantly reduce drift related image corruptions. Drift-distortion commonly causes blur and distortions in the SEM images.…

仪器与探测器 · 物理学 2010-08-09 Petr Cizmar , Andras E. Vladar , Michael T. Postek

Spectroscopic photoemission microscopy is a well-established method to investigate the electronic structure of surfaces. In modern photoemission microscopes the electron optics allows imaging of the image plane, momentum plane, or…

Low-temperature scanning tunneling spectroscopy allows to probe the electronic properties of clusters at surfaces with unprecedented accuracy. By means of quantum transport theory, using realistic tunneling tips, we obtain conductance…

其他凝聚态物理 · 物理学 2011-11-09 Mario De Menech , Ulf Saalmann , Martin E. Garcia

Hyperspectral imaging is a powerful technology that is plagued by large dimensionality. Herein, we explore a way to combat that hindrance via non-contiguous and contiguous (simpler to realize sensor) band grouping for dimensionality…

图像与视频处理 · 电气工程与系统科学 2019-05-31 Muhammad Aminul Islam , Derek T. Anderson , John E. Ball , Nicolas H. Younan