相关论文: Mixed-level identification of fault redundancy in …
This paper presents a detailed evaluation of the efficiency of software-only techniques to mitigate SEU and SET in microprocessors. A set of well-known rules is presented and implemented automatically to transform an unprotected program…
Machine fault diagnosis (FD) is a critical task for predictive maintenance, enabling early fault detection and preventing unexpected failures. Despite its importance, existing FD models are operation-specific with limited generalization…
We are experiencing an explosion in the amount of sensors measuring our activities and the world around us. These sensors are spread throughout the built environment and can help us perform state estimation and control of related systems,…
The prompt and accurate detection of faults and abnormalities in electric transmission lines is a critical challenge in smart grid systems. Existing methods mostly rely on model-based approaches, which may not capture all the aspects of…
This paper addresses the problem of robust process and sensor fault reconstruction for nonlinear systems. The proposed method augments the system dynamics with an approximated internal linear model of the combined contribution of known…
This paper addresses two critical challenges in analog In-Memory Computing (IMC) systems that limit their scalability and deployability: the computational unreliability caused by stuck-at faults (SAFs) and the high compilation overhead of…
This paper aims to develop an effective model-free inference procedure for high-dimensional data. We first reformulate the hypothesis testing problem via sufficient dimension reduction framework. With the aid of new reformulation, we…
Deep learning methods have shown promising performance in fault diagnosis for multimode process. Most existing studies assume that the collected health state categories from different operating modes are identical. However, in real…
The aim of this paper is to propose an alternative method to solve a Fault Tolerant Control problem. The model is a linear system affected by a disturbance term: this represents a large class of technological faulty processes. The goal is…
The CMOS integrated chips at advanced technology nodes are becoming more vulnerable to various sources of faults like manufacturing imprecisions, variations, aging, etc. Additionally, the intentional fault attacks (e.g., high power…
Cloud computing systems fail in complex and unforeseen ways due to unexpected combinations of events and interactions among hardware and software components. These failures are especially problematic when they are silent, i.e., not…
This paper proposes a time-domain fault location identification method for mixed overhead-underground power distribution systems that can handle challenging fault scenarios such as sub-cycle faults, arcing faults and evolving faults. The…
The predicted reduced resiliency of next-generation high performance computers means that it will become necessary to take into account the effects of randomly occurring faults on numerical methods. Further, in the event of a hard fault…
Automatic test generation aims to save developers time and effort by producing test suites with reasonably high coverage and fault detection. However, the focus of search-based generation tools in maximizing coverage leaves other…
As intelligent computing devices increasingly integrate into human life, ensuring the functional safety of the corresponding electronic chips becomes more critical. A key metric for functional safety is achieving a sufficient fault…
Fault-tolerant coverage control involves determining a trajectory that enables an autonomous agent to cover specific points of interest, even in the presence of actuation and/or sensing faults. In this work, the agent encounters control…
Automated tests play an important role in software evolution because they can rapidly detect faults introduced during changes. In practice, code-coverage metrics are often used as criteria to evaluate the effectiveness of test suites with…
The Functional Failure Rate analysis of today's complex circuits is a difficult task and requires a significant investment in terms of human efforts, processing resources and tool licenses. Thereby, de-rating or vulnerability factors are a…
In processing and manufacturing industries, there has been a large push to produce higher quality products and ensure maximum efficiency of processes. This requires approaches to effectively detect and resolve disturbances to ensure optimal…
Identifying the optimal diagnostic test and hardware system instance to infer reliability characteristics using field data is challenging, especially when constrained by fixed budgets and minimal maintenance cycles. Active Learning (AL) has…