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相关论文: A Systematic Review of Unsupervised Learning Techn…

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Software defect prediction models are classifiers that are constructed from historical software data. Such software defect prediction models have been proposed to help developers optimize the limited Software Quality Assurance (SQA)…

软件工程 · 计算机科学 2021-02-25 Jirayus Jiarpakdee , Chakkrit Tantithamthavorn , John Grundy

Semi-supervised learning frameworks usually adopt mutual learning approaches with multiple submodels to learn from different perspectives. To avoid transferring erroneous pseudo labels between these submodels, a high threshold is usually…

计算机视觉与模式识别 · 计算机科学 2023-01-11 Hao Xu , Hui Xiao , Huazheng Hao , Li Dong , Xiaojie Qiu , Chengbin Peng

Supervised fine-tuning (SFT) is a critical step in aligning large language models (LLMs) with human instructions and values, yet many aspects of SFT remain poorly understood. We trained a wide range of base models on a variety of datasets…

计算与语言 · 计算机科学 2025-10-31 Yuto Harada , Yusuke Yamauchi , Yusuke Oda , Yohei Oseki , Yusuke Miyao , Yu Takagi

Three important issues are often encountered in Supervised and Semi-Supervised Classification: class-memberships are unreliable for some training units (label noise), a proportion of observations might depart from the main structure of the…

应用统计 · 统计学 2020-07-02 Andrea Cappozzo , Francesca Greselin , Thomas Brendan Murphy

Self-supervised contrastive learning is a powerful tool to learn visual representation without labels. Prior work has primarily focused on evaluating the recognition accuracy of various pre-training algorithms, but has overlooked other…

计算机视觉与模式识别 · 计算机科学 2022-06-13 Yuanyi Zhong , Haoran Tang , Junkun Chen , Jian Peng , Yu-Xiong Wang

Software defect prediction models can assist software testing initiatives by prioritizing testing error-prone modules. In recent years, in addition to the traditional defect prediction model approach of predicting defects from class,…

软件工程 · 计算机科学 2024-11-11 Susmita Haldar , Luiz Fernando Capretz

The use of learning-based methods for vehicle behavior prediction is a promising research topic. However, many publicly available data sets suffer from class distribution skews which limits learning performance if not addressed. This paper…

机器人学 · 计算机科学 2021-09-23 Theodor Westny , Erik Frisk , Björn Olofsson

We consider statistical inference under a semi-supervised setting where we have access to both a labeled dataset consisting of pairs $\{X_i, Y_i \}_{i=1}^n$ and an unlabeled dataset $\{ X_i \}_{i=n+1}^{n+N}$. We ask the question: under what…

统计理论 · 数学 2025-03-20 Zichun Xu , Daniela Witten , Ali Shojaie

Decision Focused Learning has emerged as a critical paradigm for integrating machine learning with downstream optimisation. Despite its promise, existing methodologies predominantly rely on probabilistic models and focus narrowly on task…

机器学习 · 计算机科学 2025-03-21 Keivan Shariatmadar , Neil Yorke-Smith , Ahmad Osman , Fabio Cuzzolin , Hans Hallez , David Moens

Software defect prediction is a critical aspect of software quality assurance, as it enables early identification and mitigation of defects, thereby reducing the cost and impact of software failures. Over the past few years, quantum…

软件工程 · 计算机科学 2024-12-11 Md Nadim , Mohammad Hassan , Ashis Kumar Mandal , Chanchal K. Roy

Semi-supervised learning, i.e. jointly learning from labeled and unlabeled samples, is an active research topic due to its key role on relaxing human supervision. In the context of image classification, recent advances to learn from…

计算机视觉与模式识别 · 计算机科学 2020-06-30 Eric Arazo , Diego Ortego , Paul Albert , Noel E. O'Connor , Kevin McGuinness

Unsupervised Anomaly Detection (UAD) with incremental training is crucial in industrial manufacturing, as unpredictable defects make obtaining sufficient labeled data infeasible. However, continual learning methods primarily rely on…

计算机视觉与模式识别 · 计算机科学 2024-01-03 Jiaqi Liu , Kai Wu , Qiang Nie , Ying Chen , Bin-Bin Gao , Yong Liu , Jinbao Wang , Chengjie Wang , Feng Zheng

Complex data mining has wide application value in many fields, especially in the feature extraction and classification tasks of unlabeled data. This paper proposes an algorithm based on self-supervised learning and verifies its…

机器学习 · 计算机科学 2025-04-08 Yingbin Liang , Lu Dai , Shuo Shi , Minghao Dai , Junliang Du , Haige Wang

Reliable and robust evaluation methods are a necessary first step towards developing machine learning models that are themselves robust and reliable. Unfortunately, current evaluation protocols typically used to assess classifiers fail to…

机器学习 · 计算机科学 2025-05-26 Michael W. Spratling

Software defect prediction (SDP) is crucial for delivering high-quality software products. Recent research has indicated that prediction performance improvements in SDP are achievable by applying hyperparameter tuning to a particular SDP…

软件工程 · 计算机科学 2025-10-30 Mohamed Sami Rakha , Andriy Miranskyy , Daniel Alencar da Costa

We review motivations, definition, approaches, and methodology for unsupervised cross-lingual learning and call for a more rigorous position in each of them. An existing rationale for such research is based on the lack of parallel data for…

计算与语言 · 计算机科学 2021-12-28 Mikel Artetxe , Sebastian Ruder , Dani Yogatama , Gorka Labaka , Eneko Agirre

In many real-world scenarios, obtaining large amounts of labeled data can be a daunting task. Weakly supervised learning techniques have gained significant attention in recent years as an alternative to traditional supervised learning, as…

In semi-supervised representation learning frameworks, when the number of labelled data is very scarce, the quality and representativeness of these samples become increasingly important. Existing literature on semi-supervised learning…

计算机视觉与模式识别 · 计算机科学 2024-11-05 Shuvendu Roy , Ali Etemad

Labeled data used for training activity recognition classifiers are usually limited in terms of size and diversity. Thus, the learned model may not generalize well when used in real-world use cases. Semi-supervised learning augments labeled…

机器学习 · 计算机科学 2018-01-25 Ming Zeng , Tong Yu , Xiao Wang , Le T. Nguyen , Ole J. Mengshoel , Ian Lane

In this review, automatic defect inspection algorithms that analyze Scanning Electron Microscopy (SEM) images for Semiconductor Manufacturing (SM) are identified, categorized, and discussed. This is a topic of critical importance for the SM…

图像与视频处理 · 电气工程与系统科学 2025-06-02 Enrique Dehaerne , Bappaditya Dey , Victor Blanco , Jesse Davis
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