相关论文: A Range Matching CAM for Hierarchical Defect Toler…

Autonomously detecting and recovering from faults is one approach for reducing the operational complexity and costs associated with managing computing environments. We present a novel methodology for autonomously generating investigation…

Through one decade's development, the kernel-based regularization method (KRM) has become a complement to the classical maximum likelihood/prediction error method and an emerging new system identification paradigm. One recent example is its…

Large-scale multi-layer networks with large numbers of nodes, edges, and layers arise across various domains, which poses a great computational challenge for the downstream analysis. In this paper, we develop an efficient randomized…

In semiconductor manufacturing, early detection of wafer defects is critical for product yield optimization. However, raw wafer data from wafer quality tests are often complex, unlabeled, imbalanced and can contain multiple defects on a…

Accurate Defect detection is crucial for ensuring the trustworthiness of intelligent railway systems. Current approaches rely on single deep-learning models, like CNNs, which employ a large amount of data to capture underlying patterns.…

A maximally stable extreme region (MSER) analysis based convolutional neural network (CNN) for unified defect detection framework is proposed in this paper. Our proposed framework utilizes the generality and stability of MSER to generate…

Large-scale integration of emerging nanoscale non-volatile memory devices, e.g. resistive random-access memory (RRAM), can enable a new generation of neuromorphic computers that can solve a wide range of machine learning problems. Such…

Latency Based Tiling provides a systems based approach to deriving approximate tiling solution that maximizes locality while maintaining a fast compile time. The method uses triangular loops to characterize miss ratio scaling of a machine…

Fabrication process variations are a major source of yield degradation in the nano-scale design of integrated circuits (IC), microelectromechanical systems (MEMS) and photonic circuits. Stochastic spectral methods are a promising technique…

Fabrication process variations can significantly influence the performance and yield of nano-scale electronic and photonic circuits. Stochastic spectral methods have achieved great success in quantifying the impact of process variations,…

Accurate methods of assessing the performance of quantum gates are extremely important. Quantum process tomography and randomized benchmarking are the current favored methods. Quantum process tomography gives detailed information, but…

Through Random Telegraph Noise (RTN) analysis, valuable information can be provided about the role of defect traps in fine tuning and reading of the state of a nanoelectronic device. However, time domain analysis techniques exhibit their…

The performance (accuracy and robustness) of several clustering algorithms is studied for linearly dependent random variables in the presence of noise. It turns out that the error percentage quickly increases when the number of observations…

In semiconductor manufacturing, wafer defect maps (WDMs) play a crucial role in diagnosing issues and enhancing process yields by revealing critical defect patterns. However, accurately categorizing WDM defects presents significant…

Recent advances in machine learning and neuro-inspired systems enabled the increased interest in efficient pattern recognition at the edge. A wide variety of applications, such as near-sensor classification, require fast and low-power…

Due to the high similarity of disparity between consecutive frames in video sequences, the area where disparity changes is defined as the residual map, which can be calculated. Based on this, we propose RecSM, a network based on residual…

To cope with the soft errors and make full use of the multi-core system, this paper gives an efficient fault-tolerant hardware and software co-designed architecture for multi-core systems. And with a not large number of test patterns, it…

Despite their significant advantages over competing technologies, nanopore sequencers are plagued by high error rates, due to physical characteristics of the nanopore and inherent noise in the biological processes. It is thus paramount not…

GNSS localization using everyday mobile devices is challenging in urban environments, as ranging errors caused by the complex propagation of satellite signals and low-quality onboard GNSS hardware are blamed for undermining positioning…

Scanning Electron Microscopy (SEM) is a widely used tool for nanoparticle characterization, but long-term directional drift can compromise image quality. We present a novel algorithm for post-imaging drift correction in SEM nanoparticle…