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We present a photothermal infrared spectroscopy-based approach for the chemical characterization and quantification of nanoplastics. By combining the high sensitivity of nanoelectromechanical systems (NEMS) with the wide spectral range and…

Scattering-type scanning near-field optical microscopy (s-SNOM), and its derivate, Fourier transform infrared nanospectroscopy (nano-FTIR) are emerging techniques for infrared (IR) nanoimaging and spectroscopy with applications in diverse…

Researchers from a broad spectrum of scientific and engineering disciplines are increasingly using near-field infrared spectroscopic techniques to characterize materials nondestructively and with nanoscale spatial resolution. However,…

光学 · 物理学 2023-03-21 Jonathan M. Larson , Hans A. Bechtel , Robert Kostecki

Optical nanoscopy is crucial in life and materials sciences, revealing subtle cellular processes and nanomaterial properties. Scattering-type Scanning Near-field Optical Microscopy (s-SNOM) provides nanoscale resolution, relying on the…

Polymeric materials are widely used in industries ranging from automotive to biomedical. Their mechanical properties play a crucial role in their application and function and arise from the nanoscale structures and interactions of their…

介观与纳米尺度物理 · 物理学 2023-08-01 Alba R. Piacenti , Casey Adam , Nicholas Hawkins , Ryan Wagner , Jacob Seifert , Yukinori Taniguchi , Roger Proksch , Sonia Contera

Atomic force microscopy (AFM) is one of the most promising methods for investigating the structure of materials at the micro and nanoscale levels, as well as their local physical-mechanical properties. The experimental data obtained with…

材料科学 · 物理学 2018-05-07 Oleg K. Garishin , Roman I. Izyumov , Alexander L. Svistkov

Nano-FTIR imaging is a powerful scanning-based technique at nanometer spatial resolution which combines Fourier transform infrared spectroscopy (FTIR) and scattering-type scanning near-field optical microscopy (s-SNOM). However, recording…

In this paper we present a new machine learning workflow with unsupervised learning techniques to identify domains within atomic force microscopy images obtained from polymer films. The goal of the workflow is to identify the spatial…

图像与视频处理 · 电气工程与系统科学 2024-09-23 Aanish Paruchuri , Yunfei Wang , Xiaodan Gu , Arthi Jayaraman

Pseudo-heterodyne scattering-type scanning near-field optical microscopy (sSNOM) is applied in the mid-infrared region to detect the chemical composition of biomolecules on the nanoscale. However, the application of sSNOM in molecular…

仪器与探测器 · 物理学 2025-08-06 Yusuke Sakiyama , Emanuel Pfitzner , Santiago H. Andany , Georg E. Fantner , Joachim Heberle

Scattering-type scanning near-field optical microscopy (s-SNOM) is instrumental in exploring polaritonic behaviors of two-dimensional (2D) materials at the nanoscale. A sharp s-SNOM tip couples momenta into 2D materials through phase…

光学 · 物理学 2019-12-30 Haomin Wang , Jiahan Li , James H. Edgar , Xiaoji G. Xu

Localized and propagating polaritons allow for highly sensitive analysis of (bio)chemical substances and processes. Nanoimaging of the polaritons evanescent fields allows for critically important experimental mode identification and for…

Fourier transform infrared nanospectroscopy (nano-FTIR) is a novel, increasingly adopted characterization method that leverages decades of established knowledge in infrared spectroscopy at the nanoscale. It opens up new possibilities in the…

光学 · 物理学 2026-05-21 Gergely Nemeth , Ferenc Borondics

Atomic Force Microscopy - Infrared (AFM-IR) spectroscopy allows spectroscopic studies in the mid-infrared spectral region with a spatial resolution better than 50 nm. We show that the high spatial resolution can be used to perform…

定量方法 · 定量生物学 2017-04-06 Luca Quaroni , Katarzyna Pogoda , Joanna-Wiltowska Zuber , Wojciech Kwiatek

IR spectroscopy has been widely used for chemical identification and quantitative analysis of reactions occurring in a specific time and space domains by measuring an average signal of the entire system1. Achieving IR measurements with…

Scattering scanning near-field optical microscopy (s-SNOM) is a powerful technique for mid-infrared spectroscopy at nanometer length scales. By investigating objects in aqueous environments through ultrathin membranes, s-SNOM has recently…

光学 · 物理学 2024-04-03 Enrico Baù , Thorsten Gölz , Martin Benoit , Andreas Tittl , Fritz Keilmann

Atomic force microscopy (AFM) phase approach-curves have significant potential for nanoscale material characterization, however, the availability of robust datasets and automated analysis tools has been limited. In this paper, we introduce…

Scattering scanning near-field optical microscopy (s-SNOM) is a technique to enhance the spatial resolution, and when combined by Fourier transform spectroscopy it can provide spectroscopic information with high spatial resolution. This…

光学 · 物理学 2024-11-21 Soheil Khajavi , Ali Eghrari , Zahra Shaterzadeh-Yazdi , Mohammad Neshat

Plastic pollution has become a critical global challenge, with microplastics pervading ecosystems and entering human food chains. Effectively monitoring this widespread contamination demands rapid, reliable, and portable material…

Artificial intelligence-based methods are becoming increasingly effective at screening libraries of polymers down to a selection that is manageable for experimental inquiry. The vast majority of presently adopted approaches for polymer…

材料科学 · 物理学 2023-02-16 Rishi Gurnani , Christopher Kuenneth , Aubrey Toland , Rampi Ramprasad

Atomic Force Microscopy - Infrared (AFM-IR) has emerged as a useful technique for measuring absorption spectra with spatial resolution better than the optical diffraction limit. The technique relies on the movement of a probe for atomic…

应用物理 · 物理学 2024-01-17 Luca Quaroni
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