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Contrast is subject to dramatic changes across the visual field, depending on the source of light and scene configurations. Hence, the human visual system has evolved to be more sensitive to contrast than absolute luminance. This feature is…

计算机视觉与模式识别 · 计算机科学 2019-02-13 Arash Akbarinia , Karl R. Gegenfurtner

Ensuring the safety of surgical instruments requires reliable detection of visual defects. However, manual inspection is prone to error, and existing automated defect detection methods, typically trained on natural/industrial images, fail…

计算机视觉与模式识别 · 计算机科学 2025-09-29 Joseph Huang , Yichi Zhang , Jingxi Yu , Wei Chen , Seunghyun Hwang , Qiang Qiu , Amy R. Reibman , Edward J. Delp , Fengqing Zhu

With the improvement of computer performance and the increase of data volume, the object detection based on convolutional neural network (CNN) has become the main algorithm for object detection. This paper summarizes the research progress…

计算机视觉与模式识别 · 计算机科学 2020-07-28 Wei Zhang , Zuoxiang Zeng

Deep convolutional networks have proven to be very successful in learning task specific features that allow for unprecedented performance on various computer vision tasks. Training of such networks follows mostly the supervised learning…

机器学习 · 计算机科学 2015-06-22 Alexey Dosovitskiy , Philipp Fischer , Jost Tobias Springenberg , Martin Riedmiller , Thomas Brox

We present a convolutional network capable of inferring a 3D representation of a previously unseen object given a single image of this object. Concretely, the network can predict an RGB image and a depth map of the object as seen from an…

计算机视觉与模式识别 · 计算机科学 2016-08-03 Maxim Tatarchenko , Alexey Dosovitskiy , Thomas Brox

Anomaly detection consists in identifying, within a dataset, those samples that significantly differ from the majority of the data, representing the normal class. It has many practical applications, e.g. ranging from defective product…

计算机视觉与模式识别 · 计算机科学 2020-11-13 Pankaj Mishra , Claudio Piciarelli , Gian Luca Foresti

When imaging through a semi-reflective medium such as glass, the reflection of another scene can often be found in the captured images. It degrades the quality of the images and affects their subsequent analyses. In this paper, a novel deep…

图像与视频处理 · 电气工程与系统科学 2022-08-11 Tingtian Li , Yuk-Hee Chan , Daniel P. K. Lun

Intrinsic image decomposition, which is an essential task in computer vision, aims to infer the reflectance and shading of the scene. It is challenging since it needs to separate one image into two components. To tackle this, conventional…

计算机视觉与模式识别 · 计算机科学 2020-05-28 Yunfei Liu , Yu Li , Shaodi You , Feng Lu

Deep convolutional neural networks have recently achieved great success on image aesthetics assessment task. In this paper, we propose an efficient method which takes the global, local and scene-aware information of images into…

计算机视觉与模式识别 · 计算机科学 2019-02-25 Xin Fu , Jia Yan , Cien Fan

Robustness of convolutional neural networks (CNNs) has gained in importance on account of adversarial examples, i.e., inputs added as well-designed perturbations that are imperceptible to humans but can cause the model to predict…

计算机视觉与模式识别 · 计算机科学 2025-07-22 Tiange Luo , Tianle Cai , Mengxiao Zhang , Siyu Chen , Di He , Liwei Wang

Low-light image enhancement is an important task in computer vision, essential for improving the visibility and quality of images captured in non-optimal lighting conditions. Inadequate illumination can lead to significant information loss…

计算机视觉与模式识别 · 计算机科学 2025-05-15 Ezequiel Perez-Zarate , Oscar Ramos-Soto , Chunxiao Liu , Diego Oliva , Marco Perez-Cisneros

Quality control is a fundamental component of many manufacturing processes, especially those involving casting or welding. However, manual quality control procedures are often time-consuming and error-prone. In order to meet the growing…

计算机视觉与模式识别 · 计算机科学 2018-09-05 Max Ferguson , Ronay Ak , Yung-Tsun Tina Lee , Kincho H. Law

We propose a neural network-based approach for collision detection with deformable objects. Unlike previous approaches based on bounding volume hierarchies, our neural approach does not require an update of the spatial data structure when…

图形学 · 计算机科学 2022-02-07 Ryan S. Zesch , Bethany R. Witemeyer , Ziyan Xiong , David I. W. Levin , Shinjiro Sueda

Machine-vision-based defect classification techniques have been widely adopted for automatic quality inspection in manufacturing processes. This article describes a general framework for classifying defects from high volume data batches…

计算机视觉与模式识别 · 计算机科学 2023-07-04 Wenbo Sun , Raed Al Kontar , Judy Jin , Tzyy-Shuh Chang

In this paper, we propose a machine vision algorithm for automatically detecting defects in patterned textures with the help of gradient space and its energy. Experiments on real fabric images with defects show that the proposed method can…

计算机视觉与模式识别 · 计算机科学 2014-03-11 V. Asha , N. U. Bhajantri , P. Nagabhushan

Current research in Computer Vision has shown that Convolutional Neural Networks (CNN) give state-of-the-art performance in many classification tasks and Computer Vision problems. The embedding of CNN, which is the internal representation…

计算机视觉与模式识别 · 计算机科学 2015-08-04 Axel Angel

A Convolutional Neural Network (CNN) is sometimes confronted with objects of changing appearance ( new instances) that exceed its generalization capability. This requires the CNN to incorporate new knowledge, i.e., to learn incrementally.…

计算机视觉与模式识别 · 计算机科学 2020-11-12 Tobias Scheck , Ana Perez Grassi , Gangolf Hirtz

An important goal in visual recognition is to devise image representations that are invariant to particular transformations. In this paper, we address this goal with a new type of convolutional neural network (CNN) whose invariance is…

计算机视觉与模式识别 · 计算机科学 2015-01-08 Julien Mairal , Piotr Koniusz , Zaid Harchaoui , Cordelia Schmid

This paper presents the application of Kolmogorov-Arnold Networks (KAN) in classifying metal surface defects. Specifically, steel surfaces are analyzed to detect defects such as cracks, inclusions, patches, pitted surfaces, and scratches.…

机器学习 · 计算机科学 2025-01-22 Maciej Krzywda , Mariusz Wermiński , Szymon Łukasik , Amir H. Gandomi

Controlling defects in semiconductor processes is important for maintaining yield, improving production cost, and preventing time-dependent critical component failures. Electron beam-based imaging has been used as a tool to survey wafers in…

计算机视觉与模式识别 · 计算机科学 2025-06-05 Chien-Fu , Huang , Katherine Sieg , Leonid Karlinksy , Nash Flores , Rebekah Sheraw , Xin Zhang