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相关论文: Advanced Methods for the Optical Quality Assurance…

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Optical inspection of 1191 silicon micro-strip sensors was performed using a custom made optical inspection setup, employing a machine-learning based approach for the defect analysis and subsequent quality assurance. Furthermore,…

仪器与探测器 · 物理学 2021-12-08 E. Lavrik , M. Shiroya , H. R. Schmidt , A. Toia , J. M. Heuser

Software quality is one of the essential aspects of a software. With increasing demand, software designs are becoming more complex, increasing the probability of software defects. Testers improve the quality of software by fixing defects.…

软件工程 · 计算机科学 2020-11-18 Mitt Shah , Nandit Pujara

A growing need exists for efficient and accurate methods for detecting defects in semiconductor materials and devices. These defects can have a detrimental impact on the efficiency of the manufacturing process, because they cause critical…

计算机视觉与模式识别 · 计算机科学 2023-08-21 Thibault Lechien , Enrique Dehaerne , Bappaditya Dey , Victor Blanco , Sandip Halder , Stefan De Gendt , Wannes Meert

The presence of any type of defect on the glass screen of smart devices has a great impact on their quality. We present a robust semi-supervised learning framework for intelligent micro-scaled localization and classification of defects on a…

计算机视觉与模式识别 · 计算机科学 2020-10-05 M Usman Maqbool Bhutta , Shoaib Aslam , Peng Yun , Jianhao Jiao , Ming Liu

Atomic scale characterization and manipulation with scanning probe microscopy rely upon the use of an atomically sharp probe. Here we present automated methods based on machine learning to automatically detect and recondition the quality of…

介观与纳米尺度物理 · 物理学 2018-03-26 Mohammad Rashidi , Robert A. Wolkow

The motor control board has various defects such as inconsistent color differences, incorrect plug-in positions, solder short circuits, and more. These defects directly affect the performance and stability of the motor control board,…

计算机视觉与模式识别 · 计算机科学 2025-05-26 Jingde Huang , Zhangyu Huang , Chenyu Li , Jiantong Liu

Automated visual inspection in the semiconductor industry aims to detect and classify manufacturing defects utilizing modern image processing techniques. While an earliest possible detection of defect patterns allows quality control and…

机器学习 · 计算机科学 2024-06-11 Tobias Schlosser , Frederik Beuth , Michael Friedrich , Danny Kowerko

A generic fast method for object classification is proposed. In addition, a method for dimensional reduction is presented. The presented algorithms have been applied to real-world data from chip fabrication successfully to the task of…

机器学习 · 计算机科学 2021-08-27 Thomas Olschewski

Controlling crystalline material defects is crucial, as they affect properties of the material that may be detrimental or beneficial for the final performance of a device. Defect analysis on the sub-nanometer scale is enabled by…

材料科学 · 物理学 2021-06-03 Nik Dennler , Antonio Foncubierta-Rodriguez , Titus Neupert , Marilyne Sousa

Laser cutting is a widely adopted technology in material processing across various industries, but it generates a significant amount of dust, smoke, and aerosols during operation, posing a risk to both the environment and workers' health.…

计算机视觉与模式识别 · 计算机科学 2025-11-21 Mohamed Abdallah Salem , Hamdy Ahmed Ashur , Ahmed Elshinnawy

Hardware reliability is adversely affected by the downscaling of semiconductor devices and the scale-out of systems necessitated by modern applications. Apart from crashes, this unreliability often manifests as silent data corruptions…

分布式、并行与集群计算 · 计算机科学 2021-11-30 Vassilis Vassiliadis , Konstantinos Parasyris , Christos D. Antonopoulos , Spyros Lalis , Nikolaos Bellas

Following the success of machine vision systems for on-line automated quality control and inspection processes, an object recognition solution is presented in this work for two different specific applications, i.e., the detection of quality…

计算机视觉与模式识别 · 计算机科学 2022-07-01 Kai Yao , Alberto Ortiz , Francisco Bonnin-Pascual

Deep learning is now the gold standard in computer vision-based quality inspection systems. In order to detect defects, supervised learning is often utilized, but necessitates a large amount of annotated images, which can be costly:…

计算机视觉与模式识别 · 计算机科学 2021-07-23 Pierre Gutierrez , Maria Luschkova , Antoine Cordier , Mustafa Shukor , Mona Schappert , Tim Dahmen

We present an automated vision-based system for defect detection and classification of laser power meter sensor coatings. Our approach addresses the critical challenge of identifying coating defects such as thermal damage and scratches that…

计算机视觉与模式识别 · 计算机科学 2025-09-26 Dongqi Zheng , Wenjin Fu , Guangzong Chen

Recent advances in scanning transmission electron and scanning probe microscopies have opened exciting opportunities in probing the materials structural parameters and various functional properties in real space with angstrom-level…

Fingerprint recognition requires a minimal effort from the user, does not capture other information than strictly necessary for the recognition process, and provides relatively good performance. A critical step in fingerprint identification…

计算机视觉与模式识别 · 计算机科学 2014-02-21 Amira Mohammad Abdel-Mawgoud Saleh

The growing complexity of particle detectors makes their construction and quality control a new challenge. We present studies that explore the use of deep learning-based computer vision techniques to perform quality checks of detector…

高能物理 - 实验 · 物理学 2022-03-18 N. Akchurin , J. Damgov , S. Dugad , P. G C , S. Grönroos , K. Lamichhane , J. Martinez , T. Quast , S. Undleeb , A. Whitbeck

Quality control of apparel items is mandatory in modern textile industry, as consumer's awareness and expectations about the highest possible standard is constantly increasing in favor of sustainable and ethical textile products. Such a…

计算机视觉与模式识别 · 计算机科学 2022-07-27 Marco Boresta , Tommaso Colombo , Alberto De Santis

Quality control is an essential process in manufacturing to make the product defect-free as well as to meet customer needs. The automation of this process is important to maintain high quality along with the high manufacturing throughput.…

计算机视觉与模式识别 · 计算机科学 2020-07-03 Aditya M. Deshpande , Ali A. Minai , Manish Kumar

We present systematic and efficient solutions for both observability enhancement and root-cause diagnosis of post-silicon System-on-Chips (SoCs) validation with diverse usage scenarios. We model specification of interacting flows in typical…

硬件体系结构 · 计算机科学 2021-02-10 Debjit Pal , Shobha Vasudevan
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