相关论文: Logic Design for On-Chip Test Clock Generation - I…

In order to design and implement tracers, one must decide what exactly to trace and how to produce this trace. On the one hand, trace designs are too often guided by implementation concerns and are not as useful as they should be. On the…

With the development of large-scale integrated circuits, electronic design automation~(EDA) tools are increasingly emphasizing efficiency, with parallel algorithms becoming a trend. The optimization of delay reduction is a crucial factor…

The need for reducing manufacturing defect escape in today's safety-critical applications requires increased fault coverage. However, generating a test set using commercial automatic test pattern generation (ATPG) tools that lead to…

Real-time embedded systems that combine processes of various criticalities (i.e. mixed-criticality real-time systems) represent an emerging research that faces many issues. This paper describes a new ASIC design of a coprocessor that…

Post-silicon clock tuning elements are widely used in high-performance designs to mitigate the effects of process variations and aging. Located on clock paths to flip-flops, these tuning elements can be configured through the scan chain so…

Reconstruction of how components communicate with each other during system execution is crucial for debugging system-on-chip designs. However, limited observability is the major obstacle to the efficient and accurate reconstruction in the…

This paper presents a novel encoding method for fine time data of a tapped delay line (TDL) time-to-digital Converter (TDC). It is based on divide-and-conquer strategy, and has the advantage of significantly reducing logic resource…

Controllable generative models have been widely used to improve the realism of synthetic visual content. However, such models must handle control conditions and content generation computational requirements, resulting in generally low…

To mitigate the ever-worsening Power Wall problem, more and more applications need to expand their power supply to the wide-voltage range including the near-threshold region. However, the read delay distribution of the SRAM cells under the…

Phase clocks are synchronization tools that implement a form of logical time in distributed systems. For systems tolerating transient faults by self-repair of damaged data, phase clocks can enable reasoning about the progress of distributed…

This paper discusses the feasibility of using Large Language Models LLM for code generation with a particular application in designing an RISC. The paper also reviews the associated steps such as parsing, tokenization, encoding, attention…

We study the impact of competing time delays in coupled stochastic synchronization and coordination problems. We consider two types of delays: transmission delays between interacting elements and processing, cognitive, or execution delays…

We present the test results of a low jitter Phase Locked Loop (PLL) prototype chip for the CMS Endcap Timing Layer readout chip (ETROC). This chip is based on the improved version of a clock synthesis circuit named ljCDR from the Low-Power…

This paper proposes a high-throughput energy-efficient Successive Cancellation (SC) decoder architecture for polar codes based on combinational logic. The proposed combinational architecture operates at relatively low clock frequencies…

Quantum circuit testing is essential for detecting potential faults in realistic quantum devices, while the testing process itself also suffers from the inexactness and unreliability of quantum operations. This paper alleviates the issue by…

Recent commercial hardware platforms for embedded real-time systems feature heterogeneous processing units and computing accelerators on the same System-on-Chip. When designing complex real-time application for such architectures, the…

This paper proposes a polar code construction scheme that reduces constituent-code supplemented decoding latency. Constituent codes are the sub-codewords with specific patterns. They are used to accelerate the successive cancellation…

Automatic test generation aims to save developers time and effort by producing test suites with reasonably high coverage and fault detection. However, the focus of search-based generation tools in maximizing coverage leaves other…

This work proposes a competitive scheduling approach, designed to scale to large heterogeneous multicore systems. This scheduler overcomes the challenges of (1) the high computation overhead of near-optimal schedulers, and (2) the error…

System-level test, or SLT, is an increasingly important process step in today's integrated circuit testing flows. Broadly speaking, SLT aims at executing functional workloads in operational modes. In this paper, we consolidate available…