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A notable role in understanding of microscopic electronic properties of high temperature superconductors (HTSC) belongs to angle resolved photoemission spectroscopy (ARPES). This technique supplies a direct window into reciprocal space of…

超导电性 · 物理学 2007-05-23 A. A. Kordyuk , S. V. Borisenko

Recent angle-resolved photoemission (ARPES) studies of the high Tc superconductors are reviewed. Amongst the topics discussed are: the spectral function interpretation of ARPES data and sum rules; studies of the momentum distribution and…

超导电性 · 物理学 2008-02-03 Mohit Randeria , Juan-Carlos Campuzano

We present an angle-resolved photoemission (ARPES) study on the layered transition-metal dichalcogenide 1{\em T}-TaS$_{1.2}$Se$_{0.8}$ in the metallic commensurate charge-density-wave (CDW) phase. A model calculation of the spectral…

强关联电子 · 物理学 2007-05-23 Y. Aiura , I. Hase , H. Bando , K. Yagi-Watanabe , K. Tanaka , K. Ozawa , T. Iwase , Y. Nishihara , O. Shiino , M. Oshima , M. Kubota , K. Ono

Cross-sectional transmission electron microscopy (TEM) is used to characterize an amorphous layer observed at the interface in graphite and graphene films grown via thermal decomposition of C-face 4H-SiC. The amorphous layer does not to…

材料科学 · 物理学 2015-05-28 R. Colby , M. L. Bolen , M. A. Capano , E. A. Stach

Angle resolved photoemission spectroscopy (ARPES) enables direct observation of the Fermi surface and underlying electronic structure of crystals---the basic concepts to describe all the electronic properties of solids and to understand the…

超导电性 · 物理学 2014-06-12 A. A. Kordyuk

A laser-based angle resolved photoemission (APRES) system utilizing 6 eV photons from the fourth harmonic of a mode-locked Ti:sapphire oscillator is described. This light source greatly increases the momentum resolution and photoelectron…

其他凝聚态物理 · 物理学 2007-06-08 J. D. Koralek , J. F. Douglas , N. C. Plumb , J. D. Griffith , S. T. Cundiff , H. C. Kapteyn , M. M. Murnane , D. S. Dessau

Data from angle resolved photo-emission spectroscopy (ARPES) often serves as a smoking-gun evidence for the existence of topological materials. It provides the energy dispersion curves of the topological boundary modes which characterize…

介观与纳米尺度物理 · 物理学 2015-12-08 Zohar Ringel

The electronic properties of few-layer graphene grown on the carbon-face of silicon carbide (SiC) are found to be strongly dependent on the number of layers. The carrier mobility is larger in thicker graphene because substrate-related…

介观与纳米尺度物理 · 物理学 2015-05-30 Wenjuan Zhu , Christos Dimitrakopoulos , Marcus Freitag , Phaedon Avouris

Spectroscopic studies of electronic phenomena in graphene are reviewed. A variety of methods and techniques are surveyed, from quasiparticle spectroscopies (tunneling, photoemission) to methods probing density and current response (infrared…

介观与纳米尺度物理 · 物理学 2014-07-28 D. N. Basov , M. M. Fogler , A. Lanzara , Feng Wang , Yuanbo Zhang

In this short communication, we revise and refine our previous articles on this topic to simplify the modifications to the angle-resolved photoemission spectroscopy (ARPES) spectrometers required to finally implement our idea, with minimal…

仪器与探测器 · 物理学 2026-04-07 Swapnil Patil

We examine multiple techniques for extracting information from angle-resolved photoemission spectroscopy (ARPES) data, and test them against simulated spectral functions for electron-phonon coupling. We find that, in the low-coupling…

强关联电子 · 物理学 2015-05-18 C. N. Veenstra , G. L. Goodvin , M. Berciu , A. Damascelli

Angle-resolved photoemission spectroscopy (ARPES) measures the single-particle excitations of a many-body quantum system with both energy and momentum resolution, providing detailed information about strongly interacting materials. ARPES is…

Angle-resolved photoemission spectroscopy (ARPES) is a technique used to map the occupied electronic structure of solids. Recent progress in X-ray focusing optics has led to the development of ARPES into a microscopic tool, permitting the…

The angle-resolved photoemission spectroscopy (ARPES) is one powerful experimental technique to study the electronic structure of materials. As many electron materials show unusual many-body correlations, the technique to detect directly…

超导电性 · 物理学 2020-05-12 Yuehua Su , Chao Zhang

Angle-resolved photoemission spectroscopy (ARPES) is one of the most direct methods of studying the electronic structure of solids. By measuring the kinetic energy and angular distribution of the electrons photoemitted from a sample…

强关联电子 · 物理学 2013-03-07 Riccardo Comin , Andrea Damascelli

Knowing the band structure of materials is one of the prerequisites to understand their properties. Therefore, especially in the last decades, angle-resolved photoemission spectroscopy (ARPES) has become a highly demanded experimental tool…

材料科学 · 物理学 2017-10-17 A. M. Shuvaev , V. Dziom , N. N. Mikhailov , Z. D. Kvon , Y. Shao , D. N. Basov , A. Pimenov

Various technical developments enlarged the potential of angle-resolved photo emission (ARPES) tremendously during the last one or two decades. In particular improved momentum and energy resolution as well as the use of photon energies from…

材料科学 · 物理学 2010-10-26 J. Minár , J. Braun , S. Mankovsky , H. Ebert

Two-dimensional (2D) materials have recently been the focus of extensive research. By following a similar trend as graphene, other 2D materials including transition metal dichalcogenides (MX2) and metal mono-chalcogenides (MX) show great…

The angle-resolved photoemission (ARPES) technique has been developed rapidly over the last decay, accompanied by the improvement of energy and momentum resolutions. This technique has been established as the most powerful tool to…

强关联电子 · 物理学 2007-05-23 T. Tohyama , S. Maekawa

Identifying and studying the underlying two-electron interactions that give rise to emergent phenomena is a key step in developing a holistic understanding of quantum materials. This step is hindered by the lack of an experiment that can…

强关联电子 · 物理学 2025-05-06 A. F. Kemper , F. Goto , H. A. Labib , N. Gauthier , E. H. da Silva Neto , F. Boschini