从 dilepton 事件测量顶夸克质量与顶夸克-反夸克产生截面：Fermilab 施拉姆检测器
高能物理 - 实验
2016-08-15 v1
摘要
我们报告了对来自施拉姆Tevatron 探测器中 sqrt{s}=1.8 TeV 质子-反质子碰撞中由顶夸克-反夸克产生的 dilepton 事件的分析。该样本对应的有效辐射为 pb。我们观察到 9 个候选事件，背景估计为 个。我们测得顶夸克质量为 GeV/c^2。此外我们测得顶夸克-反夸克产生截面为 pb（假设 GeV/c^2 用于接受估计）。
引用
@article{arxiv.hep-ex/9802016,
title = {Study of the reaction pbar p -> phi phi from 1.1 to 2.0 GeV/c},
author = {C. Evangelista and A. Palano and D. Drijard and N. H. Hamann and R. T. Jones and B. Mouëllic and S. Ohlsson and J. -M. Perreau and W. Eyrich and M. Moosburger and S. Pomp and F. Stinzing and H. Fischer and J. Franz and E. Rössle and H. Schmitt and H. Wirth and A. Buzzo and K. Kirsebom and M. Lo Vetere and M. Macr\`ı and M. Marinelli and S. Passaggio and M. G. Pia and A. Pozzo and E. Robutti and A. Santroni and P. T. Debevec and R. A. Eisenstein and P. G. Harris and D. W. Hertzog and S. A. Hughes and P. E. Reimer and J. Ritter and R. Geyer and K. Kilian and W. Oelert and K. Röhrich and M. Rook and O. Steinkamp and H. Korsmo and B. Stugu and T. Johansson},
journal= {arXiv preprint arXiv:hep-ex/9802016},
year = {2016}
}
备注
13 pages, 13 figures, 2 tables, Latex. To be published in Phys. Rev. D