量子成像与计量学
量子物理
2007-05-23 v1
摘要
量子纠缠的操控已显示出提升陀螺仪、时钟甚至计算机等设备性能的巨大潜力。类似改进已在光刻与显微术中得到证实。我们概述了量子纠缠在成像与计量学中增强的一些方面。
引用
@article{arxiv.quant-ph/0306113,
title = {Quantum Imaging and Metrology},
author = {Hwang Lee and Pieter Kok and Jonathan P. Dowling},
journal= {arXiv preprint arXiv:quant-ph/0306113},
year = {2007}
}
备注
6 pages, 3 figures: Proceedings of the Sixth International Conference on Quantum Communication, Measurement and Computing, edited by J. H. Shapiro and O. Hirota (Rinton Press, 2002)