English

Ptychographic wavefront characterisation for single-particle imaging at X-ray lasers

Optics 2020-12-29 v1 Data Analysis, Statistics and Probability

Abstract

A well-characterised wavefront is important for many X-ray free-electron laser (XFEL) experiments, especially for single-particle imaging (SPI), where individual bio-molecules randomly sample a nanometer-region of highly-focused femtosecond pulses. We demonstrate high-resolution multiple-plane wavefront imaging of an ensemble of XFEL pulses, focused by Kirkpatrick-Baez (KB) mirrors, based on mixed-state ptychography, an approach letting us infer and reduce experimental sources of instability. From the recovered wavefront profiles, we show that while local photon fluence correction is crucial and possible for SPI, a small diversity of phase-tilts likely has no impact. Our detailed characterisation will aid interpretation of data from past and future SPI experiments, and provides a basis for further improvements to experimental design and reconstruction algorithms.

Keywords

Cite

@article{arxiv.2012.13783,
  title  = {Ptychographic wavefront characterisation for single-particle imaging at X-ray lasers},
  author = {Benedikt J. Daurer and Simone Sala and Max F. Hantke and Hemanth K. N. Reddy and Johan Bielecki and Zhou Shen and Carl Nettleblad and Martin Svenda and Tomas Ekeberg and Gabriella A. Carini and Philip Hart and Timur Osipov and Andrew Aquila and N. Duane Loh and Filipe R. N. C. Maia and Pierre Thibault},
  journal= {arXiv preprint arXiv:2012.13783},
  year   = {2020}
}

Comments

13 pages, 7 figures

R2 v1 2026-06-23T21:26:24.840Z