Complete spatial characterization of an optical wavefront using a variable-separation pinhole pair
Optics
2015-06-15 v1
Abstract
We present a technique for measuring the transverse spatial properties of an optical wavefront. Intensity and phase profiles are recovered by analysis of a series of interference patterns produced by the combination of a scanning X-shaped slit and a static horizontal slit; the spatial coherence may be found from the same data. We demonstrate the technique by characterizing high harmonic radiation generated in a gas cell, however the method could be extended to a wide variety of light sources.
Cite
@article{arxiv.1304.5174,
title = {Complete spatial characterization of an optical wavefront using a variable-separation pinhole pair},
author = {David T. Lloyd and Kevin O'Keeffe and Simon M. Hooker},
journal= {arXiv preprint arXiv:1304.5174},
year = {2015}
}
Comments
4 pages, 3 figures, 1 table