RAM 自测试的新方案
硬件体系结构
2011-11-09 v1
摘要
本文概述了一种名为伪环测试（PRT）的新技术。PRT 可应用于测试各种类型的随机存取存储器（RAM）：位导向或字导向以及单端口或双端口 RAM。所提出方法的一个本质特点是利用存储器自身的组件来仿真伽罗瓦域上的线性自动机。
引用
@article{arxiv.0710.4657,
title = {New Schemes for Self-Testing RAM},
author = {Gh. Bodean and D. Bodean and A. Labunetz},
journal= {arXiv preprint arXiv:0710.4657},
year = {2011}
}
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