New Electroweak Tests for the Topflavour Model

Jong Chul Lee; Kang Young Lee

New Electroweak Tests for the Topflavour Model

高能物理 - 唯象学 2007-05-23 v1

作者: Jong Chul Lee , Kang Young Lee

摘要

We explore phenomenologies of the topflavour model for the LEP experiment at $m_{_Z}$ scale. Implications of the model on the $Z$ peak data are studied in terms of the precision variables $\epsilon_i$ 's.

引用

@article{arxiv.hep-ph/9803249,
  title  = {New Electroweak Tests for the Topflavour Model},
  author = {Jong Chul Lee and Kang Young Lee},
  journal= {arXiv preprint arXiv:hep-ph/9803249},
  year   = {2007}
}

备注

5 pages (including 1 figs), Use sprocl.sty (attached in the end of the manuscript), Talk delivered at the first APCTP Workshop on Pacific Particle Physic Phenomenology, Oct. 31 -- Nov. 2, 1997, Seoul, Korea

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