English

Minimal material, maximum coverage: Silicon Tracking System for high-occupancy conditions

Instrumentation and Detectors 2025-03-21 v1

Abstract

Silicon strip sensors have long been a reliable technology for particle detection. Here, we push the limits of silicon tracking detectors by targeting an unprecedentedly low material budget of 2%-7% X0X_0 in an 8-layer 4 m2^2 detector designed for high-occupancy environments (\leq 10 MHz/cm2^2). To achieve this, we employ Double-Sided Double Metal (DSDM) silicon microstrip sensors, coupled with readout electronics capable of precise timing and energy measurements. These 320 μ\mum thick sensors, featuring 2×10242\times 1024 channels with a 58 μ\mum pitch, are connected via ultra-lightweight aluminium-polyimide microcables for signal transmission and integrated with a custom SMX readout ASIC, operating in free-streaming mode. This system enables the simultaneous measurement of time (Δt5\Delta t \simeq 5~ns) and charge deposition (0.1-100 fC), significantly enhancing the detector's capacity for high-precision track reconstruction in high-occupancy and harsh radiation field environments. The primary application of this technology is the Silicon Tracking System (STS) for the CBM experiment, with additional potential in projects like the J-PARC E16 experiment and future uses in medical physics, such as advanced imaging telescopes. In this contribution, we present the current status of CBM STS construction, with almost one-third of the modules produced and tested. We also discuss immediate applications and explore promising prospects in both scientific and medical fields.

Keywords

Cite

@article{arxiv.2503.15721,
  title  = {Minimal material, maximum coverage: Silicon Tracking System for high-occupancy conditions},
  author = {M. Teklishyn and L. M. Collazo Sánchez and U. Frankenfeld and J. M. Heuser and O. Kshyvanskyi and J. Lehnert and D. A. Ramírez Zaldivar and D. Rodríguez Garcés and A. Rodríguez Rodríguez and C. J. Schmidt and P. Semeniuk and M. Shiroya and A. Sharma and A. Toia and O. Vasylyev},
  journal= {arXiv preprint arXiv:2503.15721},
  year   = {2025}
}
R2 v1 2026-06-28T22:27:36.340Z