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Meta Omnium: A Benchmark for General-Purpose Learning-to-Learn

Computer Vision and Pattern Recognition 2023-05-15 v1 Machine Learning Machine Learning

Abstract

Meta-learning and other approaches to few-shot learning are widely studied for image recognition, and are increasingly applied to other vision tasks such as pose estimation and dense prediction. This naturally raises the question of whether there is any few-shot meta-learning algorithm capable of generalizing across these diverse task types? To support the community in answering this question, we introduce Meta Omnium, a dataset-of-datasets spanning multiple vision tasks including recognition, keypoint localization, semantic segmentation and regression. We experiment with popular few-shot meta-learning baselines and analyze their ability to generalize across tasks and to transfer knowledge between them. Meta Omnium enables meta-learning researchers to evaluate model generalization to a much wider array of tasks than previously possible, and provides a single framework for evaluating meta-learners across a wide suite of vision applications in a consistent manner.

Keywords

Cite

@article{arxiv.2305.07625,
  title  = {Meta Omnium: A Benchmark for General-Purpose Learning-to-Learn},
  author = {Ondrej Bohdal and Yinbing Tian and Yongshuo Zong and Ruchika Chavhan and Da Li and Henry Gouk and Li Guo and Timothy Hospedales},
  journal= {arXiv preprint arXiv:2305.07625},
  year   = {2023}
}

Comments

Accepted at CVPR 2023. Project page: https://edi-meta-learning.github.io/meta-omnium

R2 v1 2026-06-28T10:33:12.852Z