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Rethinking Few-Shot Image Classification: a Good Embedding Is All You Need?

Computer Vision and Pattern Recognition 2020-06-18 v2 Machine Learning

Abstract

The focus of recent meta-learning research has been on the development of learning algorithms that can quickly adapt to test time tasks with limited data and low computational cost. Few-shot learning is widely used as one of the standard benchmarks in meta-learning. In this work, we show that a simple baseline: learning a supervised or self-supervised representation on the meta-training set, followed by training a linear classifier on top of this representation, outperforms state-of-the-art few-shot learning methods. An additional boost can be achieved through the use of self-distillation. This demonstrates that using a good learned embedding model can be more effective than sophisticated meta-learning algorithms. We believe that our findings motivate a rethinking of few-shot image classification benchmarks and the associated role of meta-learning algorithms. Code is available at: http://github.com/WangYueFt/rfs/.

Keywords

Cite

@article{arxiv.2003.11539,
  title  = {Rethinking Few-Shot Image Classification: a Good Embedding Is All You Need?},
  author = {Yonglong Tian and Yue Wang and Dilip Krishnan and Joshua B. Tenenbaum and Phillip Isola},
  journal= {arXiv preprint arXiv:2003.11539},
  year   = {2020}
}

Comments

First two authors contributed equally. Project Page: https://people.csail.mit.edu/yuewang/projects/rfs/ Code: http://github.com/WangYueFt/rfs/

R2 v1 2026-06-23T14:27:09.972Z