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Regression Networks for Meta-Learning Few-Shot Classification

Machine Learning 2020-06-22 v2 Computer Vision and Pattern Recognition Machine Learning

Abstract

We propose regression networks for the problem of few-shot classification, where a classifier must generalize to new classes not seen in the training set, given only a small number of examples of each class. In high dimensional embedding spaces the direction of data generally contains richer information than magnitude. Next to this, state-of-the-art few-shot metric methods that compare distances with aggregated class representations, have shown superior performance. Combining these two insights, we propose to meta-learn classification of embedded points by regressing the closest approximation in every class subspace while using the regression error as a distance metric. Similarly to recent approaches for few-shot learning, regression networks reflect a simple inductive bias that is beneficial in this limited-data regime and they achieve excellent results, especially when more aggregate class representations can be formed with multiple shots.

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Cite

@article{arxiv.1905.13613,
  title  = {Regression Networks for Meta-Learning Few-Shot Classification},
  author = {Arnout Devos and Matthias Grossglauser},
  journal= {arXiv preprint arXiv:1905.13613},
  year   = {2020}
}

Comments

7th ICML Workshop on Automated Machine Learning (2020)

R2 v1 2026-06-23T09:35:19.028Z