Innovative full-field chromatic confocal microscopy using multispectral sensors
Abstract
A full-field chromatic confocal microscopy using a multispectral sensor was developed for quasi-one-shot microscopic 3D surface measurement. An innovative optical configuration employs a digital micromirror device (DMD) and a multispectral sensor is used to realize chromatic confocal microscopy with full-field area scanning. In the optical design, an area-scan type chromatic dispersive objective is specially designed to achieve measuring specification. Based on an 8x chromatic dispersive objective, the FOV for one shot measurement can be reached to 1.8mm*1.3mm which is immersive to microscopic profilometry. The spectral image captured by the multispectral sensor at each pinhole position has a unique spectrum pattern corresponding to its conjugate measured depth. A normalized cross-correlation (NCC) algorithm is developed to establish a spectrum-depth response curve with its corresponding spectrum pattern sets for accurate reconstruction of the tested 3D surface profile. With real test on standard targets, the measurement repeatability for a single surface depth is less than 0.6 micrometer.
Cite
@article{arxiv.1812.06573,
title = {Innovative full-field chromatic confocal microscopy using multispectral sensors},
author = {Liang-Chia Chen and Pei-Ju Tan and Chih-Jer Lin and Duc Trung Nguyen and Yu-Shuan Chou and Nguyen Dinh Nguyen and Nguyen Thanh Trung},
journal= {arXiv preprint arXiv:1812.06573},
year = {2019}
}
Comments
Conflict of interest between co-authors