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Quasi one-shot full-field surface profilometry using digital diffractive-confocal imaging correlation microscope

Optics 2019-04-24 v2 Applied Physics

Abstract

One-shot full-field surface profilometry using digital diffractive-confocal imaging correlation microscope based on digital micromirror device is developed for one-shot microscopic 3D surface measurement. Optical configuration applies confocal microscope setup and was building on DMD to generate specific pinhole array arrangement for minimizing cross talk effect. An innovative method was invented to create normalized cross correlation depth response curve from diffraction patterns of the pinhole. Using this approach, the sub-micrometer scale depth can be detected with high accuracy and precision.

Keywords

Cite

@article{arxiv.1812.06582,
  title  = {Quasi one-shot full-field surface profilometry using digital diffractive-confocal imaging correlation microscope},
  author = {Duc Trung Nguyen and Liang-Chia Chen and Nguyen Dinh Nguyen},
  journal= {arXiv preprint arXiv:1812.06582},
  year   = {2019}
}

Comments

Conflict of interest between authors

R2 v1 2026-06-23T06:44:06.567Z