Atomically thin PtSe2 films have attracted extensive research interests for potential applications in high-speed electronics, spintronics and photodetectors. Obtaining high quality, single crystalline thin films with large size is critical. Here we report the first successful layer-by-layer growth of high quality PtSe2 films by molecular beam epitaxy. Atomically thin films from 1 ML to 22 ML have been grown and characterized by low-energy electron diffraction, Raman spectroscopy and X-ray photoemission spectroscopy. Moreover, a systematic thickness dependent study of the electronic structure is revealed by angle-resolved photoemission spectroscopy (ARPES), and helical spin texture is revealed by spin-ARPES. Our work provides new opportunities for growing large size single crystalline films for investigating the physical properties and potential applications of PtSe2.
@article{arxiv.1703.04279,
title = {High quality atomically thin PtSe2 films grown by molecular beam epitaxy},
author = {Mingzhe Yan and Eryin Wang and Xue Zhou and Guangqi Zhang and Hongyun Zhang and Kenan Zhang and Wei Yao and Shuzhen Yang and Shilong Wu and Tomoki Yoshikawa and Koji Miyamoto and Taichi Okuda and Yang Wu and Pu Yu and Wenhui Duan and Shuyun Zhou},
journal= {arXiv preprint arXiv:1703.04279},
year = {2017}
}