通过X型结陷阱阵列高保真传输囚禁离子量子比特
量子物理
2013-05-29 v2
摘要
我们报告了通过一个包含独立装载/储存区和“X型结”的二维陷阱阵列，对9Be+离子进行可靠传输的实验。在传输过程中，离子在其局部势阱中的动能仅增加几个运动量子，且内态相干性得以保持。我们还研究了传输过程中两种能量增益的来源：一种特定的射频噪声加热机制和数字采样噪声。这些研究对于实现囚禁离子量子信息处理器的规模化至关重要。
引用
@article{arxiv.0901.0533,
title = {High fidelity transport of trapped-ion qubits through an X-junction trap array},
author = {R. B. Blakestad and C. Ospelkaus and A. P. VanDevender and J. M. Amini and J. Britton and D. Leibfried and D. J. Wineland},
journal= {arXiv preprint arXiv:0901.0533},
year = {2013}
}
备注
4 pages, 3 figures Updated to reduce manuscript to four pages. Some non-essential information was removed, including some waveform information and more detailed information on the trap