Four-path interference and uncertainty principle in photodetachment microscopy
量子物理
2007-05-23 v1
摘要
We study the quantal motion of electrons emitted by a pointlike monochromatic isotropic source into parallel uniform electric and magnetic fields. The two-path interference pattern in the emerging electron wave due to the electric force is modified by the magnetic lens effect which periodically focuses the beam into narrow filaments along the symmetry axis. There, four classical paths interfere. With increasing electron energy, the current distribution changes from a quantum regime governed by the uncertainty principle, to an intricate spatial pattern that yields to a semiclassical analysis.
引用
@article{arxiv.quant-ph/0106061,
title = {Four-path interference and uncertainty principle in photodetachment microscopy},
author = {Tobias Kramer and Christian Bracher and Manfred Kleber},
journal= {arXiv preprint arXiv:quant-ph/0106061},
year = {2007}
}
备注
submitted to Europhysics Letters