用于X射线能谱与衍射应用的高计数率前端ASIC研制
仪器与探测器
2019-05-15 v1
摘要
我们为Maia X射线微探针的升级研制了一款新的前端专用集成电路(ASIC)。该ASIC集成了32个可配置前端通道,可执行正或负电荷放大、脉冲整形、峰值幅度与时间提取以及缓冲模拟存储。在3.6 V/fC增益、1 μs峰值时间和248 K温度下,分别测得带与不带SDD传感器时的电子分辨率为13和10个电子(rms)。使用55Fe源在5.9 keV处获得了170 eV FWHM的能谱分辨率。通道线性度优于±1%,计数率能力可达40 kcps。该ASIC采用商用250 nm工艺制造,面积为6.3 mm x 3.9 mm,静态功耗为167 mW。
引用
@article{arxiv.1905.05311,
title = {Development of a High Rate Front-end ASIC for X-ray Spectroscopy and Diffraction Applications},
author = {Emerson Vernon and Gianluigi De Geronimo and Jonathan Baldwin and Wei Chen and Jack Fried and Gabriele Giacomini and Anthony Kuczewski and John Kuczewski and Joe Mead and Antonino Miceli and John S. Okasinski and Don Pinelli and Orlando Quaranta and Abdul K. Rumaiz and Peter Siddons and Graham Smith and Milutin Stanacevic and Russell Woods},
journal= {arXiv preprint arXiv:1905.05311},
year = {2019}
}