单质子双潘宁阱技术的演示
原子物理
2015-06-15 v1
摘要
在具有均匀磁场的潘宁阱中驱动了单个质子的自旋翻转。为了进行自旋态分析，将该质子输运至第二个叠加了磁瓶的潘宁阱中，并应用了连续 Stern-Gerlach 效应。这是首次利用单个质子演示双潘宁阱技术，表明反质子磁矩的测量精度有望提高三个数量级或更多。
引用
@article{arxiv.1305.1362,
title = {Demonstration of the Double Penning Trap Technique with a Single Proton},
author = {A. Mooser and S. Braeuninger and K. Franke and H. Kracke and C. Leiteritz and C. C. Rodegheri and H. Nagahama and G. Schneider and C. Smorra and K. Blaum and Y. Matsuda and W. Quint and J. Walz and Y. Yamazaki and S. Ulmer},
journal= {arXiv preprint arXiv:1305.1362},
year = {2015}
}