中文

利用交错锗探测器演示表面电子排斥以用于暗物质搜寻

仪器与探测器 2016-12-14 v3 星系天体物理 高能物理 - 实验

摘要

Soudan 地下实验室的 SuperCDMS 实验利用由 9 公斤低温锗探测器组成的阵列搜寻暗物质。位于相对两侧的对称传感器同时测量每次粒子相互作用产生的电荷和声子,从而在电子反冲与核反冲之间,以及表面事件与内部事件之间提供卓越的鉴别能力。我们使用两个产生约 130 次/小时 β\beta 衰变的 210^{210}Pb 源测试了表面事件排斥能力。在约 800 小时的活时间内,没有事件泄漏到 8--115 keV 的信号区域,给出的泄漏分数上限在 90% 置信水平 (C.L.) 下为 1.7×1051.7 \times 10^{-5},对应于未来 200 公斤的 SuperCDMS SNOLAB 实验中少于 0.6 个表面事件本底。

关键词

引用

@article{arxiv.1305.2405,
  title  = {Demonstration of Surface Electron Rejection with Interleaved Germanium Detectors for Dark Matter Searches},
  author = {R. Agnese and A. J. Anderson and D. Balakishiyeva and R. Basu Thakur and D. A. Bauer and A. Borgland and D. Brandt and P. L. Brink and R. Bunker and B. Cabrera and D. O. Caldwell and D. G. Cerdeno and H. Chagani and M. Cherry and J. Cooley and B. Cornell and C. H. Crewdson and P. Cushman and M. Daal and P. C. F. Di Stefano and E. Do Couto E Silva and T. Doughty and L. Esteban and S. Fallows and E. Figueroa-Feliciano and J. Fox and M. Fritts and G. L. Godfrey and S. R. Golwala and J. Hall and H. R. Harris and J. Hasi and S. A. Hertel and B. A. Hines and T. Hofer and D. Holmgren and L. Hsu and M. E. Huber and A. Jastram and O. Kamaev and B. Kara and M. H. Kelsey and S. A. Kenany and A. Kennedy and C. J. Kenney and M. Kiveni and K. Koch and B. Loer and E. Lopez Asamar and R. Mahapatra and V. Mandic and C. Martinez and K. A. McCarthy and N. Mirabolfathi and R. A. Moffatt and D. C. Moore and P. Nadeau and R. H. Nelson and L. Novak and K. Page and R. Partridge and M. Pepin and A. Phipps and K. Prasad and M. Pyle and H. Qiu and R. Radpour and W. Rau and P. Redl and A. Reisetter and R. W. Resch and Y. Ricci and T. Saab and B. Sadoulet and J. Sander and R. Schmitt and K. Schneck and R. W. Schnee and S. Scorza and D. Seitz and B. Serfass and B. Shank and D. Speller and A. Tomada and A. N. Villano and B. Welliver and D. H. Wright and S. Yellin and J. J. Yen and B. A. Young and J. Zhang},
  journal= {arXiv preprint arXiv:1305.2405},
  year   = {2016}
}

备注

5 pages, 4 figures, submitted to journal