English

Crossed laser phase plates for transmission electron microscopy

Optics 2026-03-31 v3 Instrumentation and Detectors Quantitative Methods

Abstract

For decades since the development of phase-contrast optical microscopy, an analogous approach has been sought for maximizing the image contrast of weakly-scattering objects in transmission electron microscopy (TEM). The recent development of the laser phase plate (LPP) has demonstrated that an amplified, focused laser standing wave provides stable, tunable phase shift to the high-energy electron beam, achieving phase-contrast TEM. Building on proof-of-concept experimental demonstrations, this paper explores design improvements tailored to biological imaging. In particular, we introduce the approach of crossed laser phase plates (XLPP): two laser standing waves intersecting in the diffraction plane of the TEM, rather than a single beam as in the current LPP. We provide a theoretical model for the XLPP inside the microscope and use simulations to quantify its effect on image formation. Using simulations, we find that the XLPP increases information transfer at low spatial frequencies while also suppressing the ghost images formed by Kapitza-Dirac diffraction of the electron beam by the laser beam. We also present a simple acquisition scheme, enabled by the XLPP, which dramatically suppresses unwanted diffraction effects. Finally, we discuss important practical considerations of XLPP design and show experimental results from a prototype. The results of this study chart the course for future developments of LPP hardware.

Keywords

Cite

@article{arxiv.2410.11328,
  title  = {Crossed laser phase plates for transmission electron microscopy},
  author = {Petar N. Petrov and Jessie T. Zhang and Jeremy J. Axelrod and Pavel K. Olshin and Holger Müller},
  journal= {arXiv preprint arXiv:2410.11328},
  year   = {2026}
}

Comments

18 pages, 11 figures

R2 v1 2026-06-28T19:22:08.888Z