Critical Thickness in Dewetting Films
Soft Condensed Matter
2007-05-23 v1
Abstract
We study dewetting of thin polymer films with built-in topographical fluctuations produced by rubbing the film surface with a rayon cloth. By varying the density of imposed surface defects, we unambiguously distinguish spinodal dewetting, which dominates in liquid films thinner than a characteristic thickness = 13.3 nm, from heterogeneous nucleation in the thicker films. Invariance of this characteristic thickness upon more than a decade change in the defect density makes kinetic effect an unseemly origin. A crossover of the spinodal line provides a consistent picture. This interpretation, however, contends the current understanding of molecular interactions in apolar liquid films.
Keywords
Cite
@article{arxiv.cond-mat/0110123,
title = {Critical Thickness in Dewetting Films},
author = {B. Du and Z. Yang and O. K. C. Tsui},
journal= {arXiv preprint arXiv:cond-mat/0110123},
year = {2007}
}
Comments
10 pages, 2 plots, 3 images in jpg