Scattering from rough thin films: DDA-simulations
Abstract
We investigate the wave-optical light scattering properties of deformed thin circular films of constant thickness using the discrete-dipole approximation. Effects on the intensity distribution of the scattered light due to different statistical roughness models, model dependant roughness parameters, and uncorrelated random small-scale porosity of the inhomogeneous medium are studied. The usability of discrete-dipole approximation to rough-surface scattering problems is evaluated by considering thin films as computationally feasible rough-surface analogs. The effects due to small-scale inhomogeneity of the scattering medium are compared with the analytic approximation by Maxwell Garnett and the results are found to agree with the approximation.
Cite
@article{arxiv.2010.03941,
title = {Scattering from rough thin films: DDA-simulations},
author = {Hannu Parviainen and Kari Lumme},
journal= {arXiv preprint arXiv:2010.03941},
year = {2020}
}
Comments
Published in Journal of the Optical Society of America A, Vol. 25, Issue 1 (2008)