顶点与质量约束在基于径迹的对准中的应用
仪器与探测器
2013-04-01 v2 高能物理 - 实验
摘要
利用带电粒子轨迹样本对平面径迹探测器进行软件对准，可能会导致影响顶点和动量分辨率的全局探测器畸变。我们提出了一种对准程序，通过利用从两条或多条轨迹重建的衰变顶点样本并对其不变质量施加约束，从而限制此类畸变。我们以 LHCb 谱仪中来自 衰变的不变质量约束顶点样本为例，说明了该方法如何消除曲率偏差。
引用
@article{arxiv.1207.4756,
title = {Application of vertex and mass constraints in track-based alignment},
author = {J. Amoraal and J. Blouw and S. Blusk and S. Borghi and M. Cattaneo and N. Chiapolini and G. Conti and M. Deissenroth and F. Dupertuis and R. van der Eijk and V. Fave and M. Gersabeck and A. Hicheur and W. Hulsbergen and D. Hutchcroft and A. Kozlinskiy and R. W. Lambert and F. Maciuc and R. Marki and M. Martinelli and M. Merk and M. Needham and L. Nicolas and J. Palacios and C. Parkes and A. Pellegrino and S. Pozzi and G. Raven and E. Rodrigues and C. Salzmann and M. Schiller and O. Schneider and E. Simioni and O. Steinkamp and J. van Tilburg and N. Tuning and U. Uwer and S. Vecchi and S. Viret},
journal= {arXiv preprint arXiv:1207.4756},
year = {2013}
}
备注
18 pages, 6 figures