基于Belle新电子鉴别方法的低$q^2$区域$B \to K^* e^+ e^-$衰变角分析
高能物理 - 实验
2024-09-13 v3
摘要
我们利用完整的Belle数据集，在和道中，对双电子质量平方在至范围内的衰变进行了角分析，并采用了新的电子鉴别方法以提高数据集的统计能力。该分析通过约束Wilson系数，对超出标准模型物理的右手流贡献敏感。我们对微分衰变率进行了拟合，测得横向振幅的虚部为，横向不对称度为，其中和固定为标准模型值。由此得到的约束在置信区间内与标准模型一致。
引用
@article{arxiv.2404.00201,
title = {Angular analysis of $B \to K^* e^+ e^-$ in the low-$q^2$ region with new electron identification at Belle},
author = {Belle Collaboration and D. Ferlewicz and P. Urquijo and I. Adachi and K. Adamczyk and H. Aihara and D. M. Asner and H. Atmacan and R. Ayad and V. Babu and Sw. Banerjee and P. Behera and K. Belous and J. Bennett and M. Bessner and V. Bhardwaj and B. Bhuyan and T. Bilka and D. Biswas and D. Bodrov and M. Bračko and P. Branchini and T. E. Browder and A. Budano and M. Campajola and L. Cao and D. Červenkov and M. -C. Chang and B. G. Cheon and K. Chilikin and H. E. Cho and K. Cho and S. -K. Choi and Y. Choi and S. Choudhury and S. Das and N. Dash and G. de Marino and G. De Pietro and R. Dhamija and F. Di Capua and J. Dingfelder and Z. Doležal and T. V. Dong and S. Dubey and P. Ecker and D. Epifanov and T. Ferber and B. G. Fulsom and V. Gaur and A. Garmash and A. Giri and P. Goldenzweig and E. Graziani and T. Gu and Y. Guan and K. Gudkova and C. Hadjivasiliou and T. Hara and K. Hayasaka and H. Hayashii and S. Hazra and M. T. Hedges and D. Herrmann and W. -S. Hou and C. -L. Hsu and T. Iijima and A. Ishikawa and R. Itoh and M. Iwasaki and W. W. Jacobs and S. Jia and Y. Jin and A. B. Kaliyar and C. Kiesling and C. H. Kim and D. Y. Kim and K. -H. Kim and Y. -K. Kim and K. Kinoshita and P. Kodyš and T. Konno and A. Korobov and S. Korpar and E. Kou and E. Kovalenko and P. Križan and P. Krokovny and T. Kuhr and R. Kumar and K. Kumara and A. Kuzmin and Y. -J. Kwon and Y. -T. Lai and T. Lam and S. C. Lee and D. Levit and P. Lewis and L. K. Li and Y. B. Li and L. Li Gioi and J. Libby and D. Liventsev and Y. Ma and D. Matvienko and F. Meier and M. Merola and F. Metzner and K. Miyabayashi and R. Mizuk and G. B. Mohanty and I. Nakamura and M. Nakao and A. Natochii and L. Nayak and S. Nishida and S. Ogawa and H. Ono and S. Pardi and J. Park and A. Passeri and S. Patra and S. Paul and T. K. Pedlar and R. Pestotnik and L. E. Piilonen and T. Podobnik and E. Prencipe and M. T. Prim and N. Rout and G. Russo and S. Sandilya and V. Savinov and G. Schnell and C. Schwanda and Y. Seino and K. Senyo and M. E. Sevior and W. Shan and C. Sharma and J. -G. Shiu and B. Shwartz and E. Solovieva and M. Starič and M. Sumihama and M. Takizawa and U. Tamponi and K. Tanida and F. Tenchini and M. Uchida and Y. Unno and S. Uno and Y. Ushiroda and S. E. Vahsen and K. E. Varvell and E. Wang and M. -Z. Wang and S. Watanuki and E. Won and B. D. Yabsley and W. Yan and S. B. Yang and J. Yelton and J. H. Yin and C. Z. Yuan and L. Yuan and Y. Yusa and Z. P. Zhang and V. Zhilich and V. Zhukova},
journal= {arXiv preprint arXiv:2404.00201},
year = {2024}
}
备注
Accepted by PRD