A Versatile Side Entry Laser System for Scanning Transmission Electron Microscopy
Abstract
We present the design and implementation of a side entry laser system designed for an ultra-high vacuum scanning transmission electron microscope. This system uses a versatile probe design enclosed in a vacuum envelope such that parts can be easily aligned, modified, or exchanged without disturbing the vacuum. The system uses a mirror mounted on the sample holder such that the sample can be illuminated without being tilted. Notably the mirror can be removed and replaced with an ablation target and a higher power laser used to ablate material directly onto the sample. We argue that new capabilities hold the potential to transform the electron microscope from an analysis tool towards a more flexible synthesis system, where atomic scale fabrication and atom-by-atom experiments can be performed.
Cite
@article{arxiv.2407.09461,
title = {A Versatile Side Entry Laser System for Scanning Transmission Electron Microscopy},
author = {Ondrej Dyck and Olugbenga Olunloyo and Kai Xiao and Benjamin Wolf and Thomas M. Moore and Andrew R. Lupini and Stephen Jesse},
journal= {arXiv preprint arXiv:2407.09461},
year = {2024}
}