A Scanning Electron Microscope for Ultracold Atoms
统计力学
2007-05-23 v1
摘要
We propose a new technique for the detection of single atoms in ultracold quantum gases. The technique is based on scanning electron microscopy and employs the electron impact ionization of trapped atoms with a focussed electron probe. Subsequent detection of the resulting ions allows for the reconstruction of the atoms position. This technique is expected to achieve a much better spatial resolution compared to any optical detection method. In combination with the sensitivity to single atoms, it makes new in situ measurements of atomic correlations possible. The detection principle is also well suited for the addressing of individual sites in optical lattices.
关键词
引用
@article{arxiv.cond-mat/0607358,
title = {A Scanning Electron Microscope for Ultracold Atoms},
author = {T. Gericke and C. Utfeld and N. Hommerstad and H. Ott},
journal= {arXiv preprint arXiv:cond-mat/0607358},
year = {2007}
}
备注
5 pages, 2 figures