Machine Learning · Computer Science
Deep-XFCT: Deep learning 3D-mineral liberation analysis with micro X-ray fluorescence and computed tomography
Patrick Kin Man Tung, Amalia Yunita Halim, Huixin Wang, Anne Rich +2
2022-08-29
Data Analysis, Statistics and Probability · Physics
Compressive Sensing for Dynamic XRF Scanning
George Kourousias, Fulvio Billè, Roberto Borghes, Antonio Alborini +3
2020-05-13
Computer Vision and Pattern Recognition · Computer Science
X-Field: A Physically Grounded Representation for 3D X-ray Reconstruction
Feiran Wang, Jiachen Tao, Junyi Wu, Haoxuan Wang +4
2025-03-12
Materials Science · Physics
Folding a 2-D powder diffraction image into a 1-D scan: a new procedure
Antonio Cervellino, Cinzia Giannini, Antonietta Guagliardi, Massimo Ladisa
2008-12-02
Image and Video Processing · Electrical Eng. & Systems
Denoising Fast X-Ray Fluorescence Raster Scans of Paintings
Henry Chopp, Alicia McGeachy, Matthias Alfeld, Oliver Cossairt +2
2022-06-07
Graphics · Computer Science
Splat and Replace: 3D Reconstruction with Repetitive Elements
Nicolás Violante, Andreas Meuleman, Alban Gauthier, Frédo Durand +2
2025-06-10
Computer Vision and Pattern Recognition · Computer Science
X-Ray: A Sequential 3D Representation For Generation
Tao Hu, Wenhang Ge, Yuyang Zhao, Gim Hee Lee
2024-06-04
Applied Physics · Physics
Element sensitive reconstruction of nanostructured surfaces with finite elements and grazing incidence soft X-ray fluorescence
Victor Soltwisch, Philipp Hönicke, Yves Kayser, Janis Eilbracht +3
2018-04-06
Computer Vision and Pattern Recognition · Computer Science
3D Gaussian as a New Era: A Survey
Ben Fei, Jingyi Xu, Rui Zhang, Qingyuan Zhou +2
2024-07-11
Computer Vision and Pattern Recognition · Computer Science
Improving Neural Radiance Field using Near-Surface Sampling with Point Cloud Generation
Hye Bin Yoo, Hyun Min Han, Sung Soo Hwang, Il Yong Chun
2024-03-19
Computational Physics · Physics
A semi-analytical approach for the characterization of ordered 3D nano structures using grazing-incidence X-ray fluorescence
K. V. Nikolaev, V. Soltwisch, P. Hoenicke, F. Scholze +5
2024-04-22
Materials Science · Physics
Geometrical Optics Formalism to Model Contrast in Dark-Field X-ray Microscopy
H. F. Poulsen, L. E. Dresselhaus-Marais, M. A. Carlsen, C. Detlefs +1
2022-03-10