A new procedure aiming at folding a powder diffraction 2-D into a 1-D scan is presented. The technique consists of three steps: tracking the beam centre by means of a Simulated Annealing (SA) of the diffraction rings along the same axis, detector tilt and rotation determination by a Hankel Lanczos Singular Value Decomposition (HLSVD) and intensity integration by an adaptive binning algorithm. The X-ray powder diffraction (XRPD) intensity profile of the standard NIST Si 640c sample is used to test the performances. Results show the robustness of the method and its capability of efficiently tagging the pixels in a 2-D readout system by matching the ideal geometry of the detector to the real beam-sample-detector frame. The whole technique turns out in a versatile and user-friendly tool for the 2ϑ scanning of 2-D XRPD profiles.
@article{arxiv.cond-mat/0601576,
title = {Folding a 2-D powder diffraction image into a 1-D scan: a new procedure},
author = {Antonio Cervellino and Cinzia Giannini and Antonietta Guagliardi and Massimo Ladisa},
journal= {arXiv preprint arXiv:cond-mat/0601576},
year = {2008}
}