Related papers: Dynamic phase microscopy: measurements of translat…
A high-sensitive interferometric scheme is presented. It is based on homodyne detection and squeezed vacuum phase properties. The resulting phase sensitivity scales as $\delta\phi \simeq {1/4} \bar{n}^{-1}$ with respect to input photons…
We report the development of a scanning force microscope based on an ultra-sensitive silicon nitride membrane transducer. Our development is made possible by inverting the standard microscope geometry - in our instrument, the substrate is…
The spatial resolution of imaging magnetometers has benefited from scanning probe techniques. The requirement that the sample perturbs the scanning probe through a magnetic field external to its volume limits magnetometry to samples with…
The center-of-mass motion of optically trapped dielectric nanoparticles in vacuum is extremely well-decoupled from its environment, making a powerful tool for measurements of feeble sub-attonewton forces. We demonstrate a method to trap and…
Aberration-corrected optics have made electron microscopy at atomic-resolution a widespread and often essential tool for nanocharacterization. Image resolution is dominated by beam energy and the numerical aperture of the lens ({\alpha}),…
Liquid-crystal microcavity lasers have attracted considerable attention because of their extraordinary tunability and sensitive response to external stimuli, and they operate generally within a specific phase. Here, we demonstrate a…
We describe an experiment involving a mass oscillating in a viscous fluid and analyze viscous damping of harmonic motion. The mechanical oscillator is tracked using a simple webcam and an image processing algorithm records the position of…
Electric Scanning Probe Microscopies are used to characterize the surface behavior of ferroelectric materials. The effects of local charge density on the chemistry and physics of ferroelectric surfaces are investigated. The kinetics and…
A broadband opto-mechanical phase shifter for photonic integrated circuits is proposed and numerically investigated. The structure consists of a mode-carrying waveguide and a deformable non-mode-carrying nanostring, which are parallel with…
Direct electron detectors in scanning transmission electron microscopy give unprecedented possibilities for structure analysis at the nanoscale. In electronic and quantum materials, this new capability gives access to, for example, emergent…
The drift tube ion mobility spectrometry (DTIMS) is a device used to detect trace chemicals, and its miniaturized design is always desired in practice engineering. In previous studies, little attention has been paid to the reaction region…
We experimentally squeeze the thermal motional state of an optically levitated nanosphere, by fast switching between two trapping frequencies. The measured phase space distribution of our particle shows the typical shape of a squeezed…
We present annular dark field scanning transmission electron microscopy (ADF-STEM) as an efficient, fast, and non-destructive nanoscale tool for monitoring solid-state phase transition. Using metal-insulator transition in vanadium dioxide…
The miniaturization of semiconductor devices to the scales where small numbers of dopants can control device properties requires the development of new techniques capable of characterizing their dynamics. Investigating single dopants…
Applying the Amplitude Difference method to Fermilab experiment E791 D+ -> pi-pi+pi+ data, we measure the low mass pi+pi- phase motion. Our results suggest a significant phase variation, compatible with the existence of an isoscalar…
Charge transport in nanostructures and thin films is fundamental to many phenomena and processes in science and technology, ranging from quantum effects and electronic correlations in mesoscopic physics, to integrated charge- or spin-based…
Measuring the electrophoretic mobility of molecules is a powerful experimental approach for investigating biomolecular processes. A frequent challenge in the context of single-particle measurements is throughput, limiting the obtainable…
Sub-nanometer displacement detection lays the solid foundation for critical applications in modern metrology. In-plane displacement sensing, however, is mainly dominated by the detection of differential photocurrent signals from…
Label-free imaging of rapidly moving, sub-diffraction sized structures has important applications in both biology and material science, as it removes the limitations associated with fluorescence tagging. However, unlabeled nanoscale…
A method for the separation and quantitative characterization of the electrostatic and Van der Waals contribution to tip-sample interaction in non-contact Scanning Force Microscopy is presented. It is based on the simultaneous measurement…