Related papers: Dynamic Force Spectroscopy: Looking at the Total H…
Atomic force microscopes have proved to be fundamental research tools in many situations where a gentle imaging process is required, and in a variety of environmental conditions, such as the study of biological samples. Among the possible…
Stepped well-ordered semiconductor surfaces are important as nanotemplates for the fabrication of one-dimensional nanostructures which are candidates of intriguing electronic properties. Therefore a detailed understanding of the underlying…
Recent frequency-modulated atomic force microscopy (FM-AFM) can measure three-dimensional force distribution between a probe and a sample surface in liquid. The force distribution is, in the present circumstances, assumed to be solvation…
Polymeric materials are widely used in industries ranging from automotive to biomedical. Their mechanical properties play a crucial role in their application and function and arise from the nanoscale structures and interactions of their…
A dual-excitation method for resonant-frequency tracking in scanning probe microscopy based on amplitude detection is developed. This method allows the cantilever to be operated at or near resonance for techniques where standard phase…
Phase Coded (PC) waveforms possess desirable Auto-Correlation Function (ACF) properties for use in radar and sonar systems. However, their spectra possess high spectral leakage due to the abrupt phase transitions between the chips in the…
The quantitative interatomic force measurements open a new pathway to materials characterization, surface science, and chemistry by elucidating the force between 'two' interacting atoms as a function of their separation. Atomic force…
Scattering scanning near-field optical microscopy (s-SNOM) is a technique to enhance the spatial resolution, and when combined by Fourier transform spectroscopy it can provide spectroscopic information with high spatial resolution. This…
A digital signal acquisition system for an Apertureless SNOM (ASNOM) based on a digital signal processing (DSP) card is presented. An electromagnetic wave scattered by an AFM-like tip is initially detected by an optical homodyning in a…
Artificial intelligence (AI) and machine learning have promised to revolutionize the way we live and work, and one of particularly promising areas for AI is image analysis. Nevertheless, many current AI applications focus on post-processing…
Electrostatic force microscopy at cryogenic temperatures is used to probe the electrostatic interaction of a conductive atomic force microscopy tip and electronic charges trapped in localized states in an insulating layer on a…
This paper is a theoretical and a numerical investigation of the stability of a tip-cantilever system used in noncontact atomic force microscopy (NC-AFM) when it oscillates close to a surface. No additional dissipative force is considered.…
While the fundamental limit on the resolution achieved in an atomic force microscope (AFM) is clearly related to the tip radius, the fact that the tip can creep and/or wear during an experiment is often ignored. This is mainly due to the…
Mechanical properties of biological samples have been imaged with a \textit{Force Feedback Microscope}. Force, force gradient and dissipation are measured simultaneously and quantitatively, merely knowing the AFM cantilever spring constant.…
We find that the jump-into-contact of the cantilever in the atomic force microscope (AFM) is caused by an inherent instability in the motion of the AFM cantilever. The analysis is based on a simple model of the cantilever moving in a…
High-frequency atomic force microscopy has enabled extraordinary new science through large bandwidth, high speed measurements of atomic and molecular structures. However, traditional optical detection schemes restrict the dimensions, and…
Atomic Force Microscopy (AFM) has become established as a powerful and a versatile tool for investigating local mechanical properties. In addition, it has been made possible to take advantage of the AFM tip-sample interaction, to perturb,…
In atomic force microscopy (AFM), the exchange and alignment of the AFM cantilever with respect to the optical beam and position-sensitive detector (PSD) are often performed manually. This process is tedious and time-consuming and sometimes…
Friction measurements in the range of several meters per second are still of great interests. With the atomic force microscopy (AFM), the oscilaltion situation of the quartz crystal resonators of 3MHz resonance frequency are studied. And…
Atomic force microscopy (AFM) can be used to characterise several aspects of the surface degradation and reinforcement mechanisms of zirconia based ceramics, such as crack propagation, martensitic relief formation, grains pull-out and…