Related papers: Dynamic Force Spectroscopy: Looking at the Total H…
Understanding the nanoscale carrier dynamics induced by light excitation is the key to unlocking futuristic devices and innovative functionalities in advanced materials. Optical pump-probe scanning tunneling microscopy (OPP-STM) has opened…
Time-resolved optical filtering (TROF) measures the spectrogram or sonogram by a fast photodiode followed a tunable narrowband optical filter. For periodic signal and to match the sonogram, numerical TROF algorithm is used to find the…
We present Magnetic Resonance Force Microscopy (MRFM) measurements of Ferromagnetic Resonance (FMR) in a 50 nm thick permalloy film, tilted with respect to the direction of the external magnetic field. At small probe-sample distances the…
An observer based adaptive detection methodology (ADM) is proposed for estimating frequency and its rate of change (RoCoF) of the voltage and/or current measurements acquired from an instrument transformer. With guaranteed convergence and…
Atomic force microscopy (AFM) routinely achieves structural information in the sub-nm length scale. Measuring time resolved properties on this length scale to understand kinetics at the nm scale remains an elusive goal. We present a general…
High resolution Atomic Force Microscopy (AFM) and Scanning Tunnelling Microscopy (STM) imaging with functionalized tips is well established, but a detailed understanding of the imaging mechanism is still missing. We present a numerical…
We present imaging and force spectroscopy measurements of DNA molecules adsorbed on functionalized mica. By means of Non-Contact mode AFM (NC-AFM) in Ultra High Vacuum (UHV), the frequency shift (\Delta f) versus separation (z) curves were…
We investigate the capillary force that applies on a tilted cylinder as a function of its dipping angle i, using a home-built tilting Atomic Force Microscope (AFM) with custom made probes. A micrometric-size rod is glued at the end of an…
Atomic Force Microscopy (AFM) conventional static force curves and Force Feedback Microscopy (FFM) force curves acquired with the same cantilever at the solid/air and solid/liquid interfaces are here compared. The capability of the FFM to…
On-chip technology based on acoustic waves is a strong asset in modern telecommunication with the prospects of becoming a cornerstone of next-generation devices. In this context, mapping and manipulating acoustic waves through coherent…
A number of aspects of magnetic force microscopy (MFM) specific to the imaging of hard magnetic films have been studied. Firstly, we show that topographic images made in tapping mode with probes characterized by the moderate cantilever…
In this paper we present a new machine learning workflow with unsupervised learning techniques to identify domains within atomic force microscopy images obtained from polymer films. The goal of the workflow is to identify the spatial…
Sensing via a mechanical frequency shift is a powerful measurement tool, and, therefore, understanding and mitigating frequency noise affecting mechanical resonators is imperative. Thermomechanical noise fundamentally limits mechanical…
The pervasive phenomenon of friction has been studied at the nanoscale by controlled manipulation of single atoms and molecules, which permitted a precise determination of the static friction force necessary to initiate motion. However,…
We propose to use the damping signal of an oscillating cantilever in dynamic atomic force microscopy as a noninvasive tool to study the vibrational structure of the substrate. We present atomically resolved maps of damping in carbon…
The topography and the electrical properties are two crucial characteristics in determining roles and functionalities of materials. Conductive atomic force microscopy (CAFM) is widely recognized for its ability to independently measure the…
Electric charge detection by atomic force microscopy (AFM) with single- electron resolution (e-EFM) is a promising way to investigate the electronic level structure of individual quantum dots (QD). The oscillating AFM tip modulates the…
Atomic Force Microscopy (AFM) enables high-resolution surface imaging at the nanoscale, yet the output is often degraded by artifacts introduced by environmental noise, scanning imperfections, and tip-sample interactions. To address this…
We demonstrate how the mixed dynamic form factor (MDFF) can be interpreted as a quadratic form. This makes it possible to use matrix diagonalization methods to reduce the number of terms that need to be taken into account when calculating…
Since the dawn of scanning probe microscopy (SPM), tapping or intermittent contact mode has been one of the most widely used imaging modes. Manual optimization of tapping mode not only takes a lot of instrument and operator time, but also…